Abstract
One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), do not possess the required spatial resolution due to the large interaction volume between the electrons from the beam and the atoms of the material. Transmission electron microscopy (TEM) has the required spatial resolution. However, due to a lack of automation in the analysis system, the rate of data acquisition is slow which limits the area of the specimen that can be characterized. This paper presents a new characterization technique, Transmission Kikuchi Diffraction (TKD), which enables the analysis of the microstructure of UFG and nanocrystalline materials using an SEM equipped with a standard EBSD system. The spatial resolution of this technique can reach 2 nm. This technique can be applied to a large range of materials that would be difficult to analyze using traditional EBSD. After presenting the experimental set up and describing the different steps necessary to realize a TKD analysis, examples of its use on metal alloys and minerals are shown to illustrate the resolution of the technique and its flexibility in term of material to be characterized.
| Language | English |
|---|---|
| Article number | e55506 |
| Pages | 1-11 |
| Number of pages | 11 |
| Journal | Journal of Visualized Experiments |
| Issue number | 122 |
| DOIs | |
| Publication status | Published - 1 Apr 2017 |
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Bibliographical note
Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.Keywords
- Engineering
- Issue 122
- Microstructure
- Electron Microscopy
- Nanocrystalline Materials
- Ultra-Fine Grained Materials
- Transmission Kikuchi Diffraction
- Electron Backscatter Diffraction
- Crystal Orientation
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Characterization of ultra-fine grained and nanocrystalline materials using Transmission Kikuchi Diffraction. / Proust, Gwénaëlle; Trimby, Patrick; Piazolo, Sandra; Retraint, Delphine.
In: Journal of Visualized Experiments, No. 122, e55506, 01.04.2017, p. 1-11.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Characterization of ultra-fine grained and nanocrystalline materials using Transmission Kikuchi Diffraction
AU - Proust, Gwénaëlle
AU - Trimby, Patrick
AU - Piazolo, Sandra
AU - Retraint, Delphine
N1 - Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.
PY - 2017/4/1
Y1 - 2017/4/1
N2 - One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), do not possess the required spatial resolution due to the large interaction volume between the electrons from the beam and the atoms of the material. Transmission electron microscopy (TEM) has the required spatial resolution. However, due to a lack of automation in the analysis system, the rate of data acquisition is slow which limits the area of the specimen that can be characterized. This paper presents a new characterization technique, Transmission Kikuchi Diffraction (TKD), which enables the analysis of the microstructure of UFG and nanocrystalline materials using an SEM equipped with a standard EBSD system. The spatial resolution of this technique can reach 2 nm. This technique can be applied to a large range of materials that would be difficult to analyze using traditional EBSD. After presenting the experimental set up and describing the different steps necessary to realize a TKD analysis, examples of its use on metal alloys and minerals are shown to illustrate the resolution of the technique and its flexibility in term of material to be characterized.
AB - One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), do not possess the required spatial resolution due to the large interaction volume between the electrons from the beam and the atoms of the material. Transmission electron microscopy (TEM) has the required spatial resolution. However, due to a lack of automation in the analysis system, the rate of data acquisition is slow which limits the area of the specimen that can be characterized. This paper presents a new characterization technique, Transmission Kikuchi Diffraction (TKD), which enables the analysis of the microstructure of UFG and nanocrystalline materials using an SEM equipped with a standard EBSD system. The spatial resolution of this technique can reach 2 nm. This technique can be applied to a large range of materials that would be difficult to analyze using traditional EBSD. After presenting the experimental set up and describing the different steps necessary to realize a TKD analysis, examples of its use on metal alloys and minerals are shown to illustrate the resolution of the technique and its flexibility in term of material to be characterized.
KW - Engineering
KW - Issue 122
KW - Microstructure
KW - Electron Microscopy
KW - Nanocrystalline Materials
KW - Ultra-Fine Grained Materials
KW - Transmission Kikuchi Diffraction
KW - Electron Backscatter Diffraction
KW - Crystal Orientation
UR - http://www.scopus.com/inward/record.url?scp=85017658773&partnerID=8YFLogxK
U2 - 10.3791/55506
DO - 10.3791/55506
M3 - Article
SP - 1
EP - 11
JO - Journal of visualized experiments : JoVE
T2 - Journal of visualized experiments : JoVE
JF - Journal of visualized experiments : JoVE
SN - 1940-087X
IS - 122
M1 - e55506
ER -