Characterization of ultra-fine grained and nanocrystalline materials using Transmission Kikuchi Diffraction

Gwénaëlle Proust, Patrick Trimby, Sandra Piazolo, Delphine Retraint

Research output: Contribution to journalArticleResearchpeer-review

Abstract

One of the challenges in microstructure analysis nowadays resides in the reliable and accurate characterization of ultra-fine grained (UFG) and nanocrystalline materials. The traditional techniques associated with scanning electron microscopy (SEM), such as electron backscatter diffraction (EBSD), do not possess the required spatial resolution due to the large interaction volume between the electrons from the beam and the atoms of the material. Transmission electron microscopy (TEM) has the required spatial resolution. However, due to a lack of automation in the analysis system, the rate of data acquisition is slow which limits the area of the specimen that can be characterized. This paper presents a new characterization technique, Transmission Kikuchi Diffraction (TKD), which enables the analysis of the microstructure of UFG and nanocrystalline materials using an SEM equipped with a standard EBSD system. The spatial resolution of this technique can reach 2 nm. This technique can be applied to a large range of materials that would be difficult to analyze using traditional EBSD. After presenting the experimental set up and describing the different steps necessary to realize a TKD analysis, examples of its use on metal alloys and minerals are shown to illustrate the resolution of the technique and its flexibility in term of material to be characterized.

LanguageEnglish
Article numbere55506
Pages1-11
Number of pages11
JournalJournal of Visualized Experiments
Issue number122
DOIs
Publication statusPublished - 1 Apr 2017

Fingerprint

Nanocrystalline materials
Electron diffraction
Nanoparticles
Diffraction
Electrons
Electron Scanning Microscopy
Microstructure
Scanning electron microscopy
Minerals
Automation
Data acquisition
Metals
Transmission Electron Microscopy
Information Systems
Transmission electron microscopy
Atoms

Bibliographical note

Version archived for private and non-commercial use with the permission of the author/s and according to publisher conditions. For further rights please contact the publisher.

Keywords

  • Engineering
  • Issue 122
  • Microstructure
  • Electron Microscopy
  • Nanocrystalline Materials
  • Ultra-Fine Grained Materials
  • Transmission Kikuchi Diffraction
  • Electron Backscatter Diffraction
  • Crystal Orientation

Cite this

Proust, Gwénaëlle ; Trimby, Patrick ; Piazolo, Sandra ; Retraint, Delphine. / Characterization of ultra-fine grained and nanocrystalline materials using Transmission Kikuchi Diffraction. In: Journal of Visualized Experiments. 2017 ; No. 122. pp. 1-11.
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Characterization of ultra-fine grained and nanocrystalline materials using Transmission Kikuchi Diffraction. / Proust, Gwénaëlle; Trimby, Patrick; Piazolo, Sandra; Retraint, Delphine.

In: Journal of Visualized Experiments, No. 122, e55506, 01.04.2017, p. 1-11.

Research output: Contribution to journalArticleResearchpeer-review

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