Close-from model of shunt capacitance and inductance of microstrip step discontinuities

Himanshu Singh*, A. K. Verma

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

Some results for the inductance and capacitance associated with a step discontinuity in a microstrip are available. We present a model on the based of K.C. Gupta proposal for inductance having a maximum deviation 5% and average deviation 3% for ∈r = 9.6 and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for ∈r = 2.3, 4.0, 15.1, 20.0 & 40.0. These techniques are used to eliminate the port discontinuities brought by the current/voltage exciting source. The closed form model for step shunt capacitance having a maximum deviation 10% and average deviation 4.66% for 2.3 ≤∈ r ≤ 40.0 against numerical results of the internal equation method. The models have average deviation 0.027 for the Cp and 0.015 for Ls against the results of Sonnet.

Original languageEnglish
Title of host publication33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-2
Number of pages2
ISBN (Print)9781424421206, 9781424421190, 1424421195
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008 - Pasadena, CA, United States
Duration: 15 Sep 200819 Sep 2008

Other

Other33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
CountryUnited States
CityPasadena, CA
Period15/09/0819/09/08

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