Closed-form expressions for accurate determination of capacitance and effective radius of microstrip circular disk

A. K. Verma; Raj Kumar; Manu Sharma

Closed-form expressions for accurate determination of capacitance and effective radius of microstrip circular disk

A. K. Verma^*, Raj Kumar, Manu Sharma

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Accurate MWM-based closed-form expressions are presented to determine total lumped capacitance C₁ and effective radius R_eff of a microstrip circular patch in the range 0.1 ≤ h / R ≤ 10 and ∈_r ≤ 1, with maximum errors of 5% and 2.5% for C_t and R_eff, respectively, on ∈_r = 1. The results are compared to those obtained with Noble's variational method. For ∈_r > 1, the error of the present model decreases. A graphical method is also presented to determine the R_eff of the circular patch, which has an accuracy of < 1.5% versus the calculated value.

Original language	English
Pages (from-to)	217-221
Number of pages	5
Journal	Microwave and Optical Technology Letters
Volume	14
Issue number	4
Publication status	Published - Mar 1997
Externally published	Yes

Keywords

Capacitance
Circular patch
Microstrip circular disk
Resonators

Cite this

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title = "Closed-form expressions for accurate determination of capacitance and effective radius of microstrip circular disk",

abstract = "Accurate MWM-based closed-form expressions are presented to determine total lumped capacitance C1 and effective radius Reff of a microstrip circular patch in the range 0.1 ≤ h / R ≤ 10 and ∈r ≤ 1, with maximum errors of 5% and 2.5% for Ct and Reff, respectively, on ∈r = 1. The results are compared to those obtained with Noble's variational method. For ∈r > 1, the error of the present model decreases. A graphical method is also presented to determine the Reff of the circular patch, which has an accuracy of < 1.5% versus the calculated value.",

keywords = "Capacitance, Circular patch, Microstrip circular disk, Resonators",

author = "Verma, {A. K.} and Raj Kumar and Manu Sharma",

year = "1997",

month = mar,

language = "English",

volume = "14",

pages = "217--221",

journal = "Microwave and Optical Technology Letters",

issn = "0895-2477",

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TY - JOUR

T1 - Closed-form expressions for accurate determination of capacitance and effective radius of microstrip circular disk

AU - Verma, A. K.

AU - Kumar, Raj

AU - Sharma, Manu

PY - 1997/3

Y1 - 1997/3

N2 - Accurate MWM-based closed-form expressions are presented to determine total lumped capacitance C1 and effective radius Reff of a microstrip circular patch in the range 0.1 ≤ h / R ≤ 10 and ∈r ≤ 1, with maximum errors of 5% and 2.5% for Ct and Reff, respectively, on ∈r = 1. The results are compared to those obtained with Noble's variational method. For ∈r > 1, the error of the present model decreases. A graphical method is also presented to determine the Reff of the circular patch, which has an accuracy of < 1.5% versus the calculated value.

AB - Accurate MWM-based closed-form expressions are presented to determine total lumped capacitance C1 and effective radius Reff of a microstrip circular patch in the range 0.1 ≤ h / R ≤ 10 and ∈r ≤ 1, with maximum errors of 5% and 2.5% for Ct and Reff, respectively, on ∈r = 1. The results are compared to those obtained with Noble's variational method. For ∈r > 1, the error of the present model decreases. A graphical method is also presented to determine the Reff of the circular patch, which has an accuracy of < 1.5% versus the calculated value.

KW - Capacitance

KW - Circular patch

KW - Microstrip circular disk

KW - Resonators

UR - http://www.scopus.com/inward/record.url?scp=0031104196&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0031104196

VL - 14

SP - 217

EP - 221

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 4

ER -

Closed-form expressions for accurate determination of capacitance and effective radius of microstrip circular disk

Abstract

Keywords

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