Comparative analysis of strain engineering on the electronic properties of homogenous and heterostructure bilayers of MoX2 (X = S, Se, Te)

Joshna Palepu, P. Pranav Anand, Pradyumna Parshi, Vishesh Jain, Aditya Tiwari, Sandip Bhattacharya, Sudipta Chakraborty, Sayan Kanungo*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Comparative analysis of strain engineering on the electronic properties of homogenous and heterostructure bilayers of MoX2 (X = S, Se, Te)'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemistry

Physics & Astronomy