Conductor thickness based dispersion models of slot-line in

Lossy Media; P. Majumdar; A. K. Verma

doi:10.1109/AMTA.2008.4762974

Conductor thickness based dispersion models of slot-line in

Lossy Media^*, P. Majumdar, A. K. Verma

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

The CAD oriented closed-form model is presented to compute frequency dependent effective relative permittivity and characteristic impedance of a slot-line with finite conductor thickness in the range 3μm-50μw. The model has average accuracy of about 2% against the full- wave results from different sources in the frequency range 2GHz-60GHz, 222≤ε_r ≤20, 0.02≤w/h≤1.0, 0.01 ≤h/λ₀≤0.25/ √(ε_r -1) The dielectric loss and conductor loss for slot lines have been computed and are found to be in excellent agreement with the practical and theoretical data available in the literature.

Original language	English
Title of host publication	2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	99-102
Number of pages	4
ISBN (Print)	9781424426904
DOIs	https://doi.org/10.1109/AMTA.2008.4762974
Publication status	Published - 2008
Externally published	Yes
Event	2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008 - Jaipur, Rajasthan, India Duration: 21 Nov 2008 → 24 Nov 2008

Other

Other	2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008
Country/Territory	India
City	Jaipur, Rajasthan
Period	21/11/08 → 24/11/08

Keywords

Conductor loss
Conductor thickness based propagation characteristics
Dielectric loss
Microwave/millimeter-wave technology
Slot-line

Access to Document

10.1109/AMTA.2008.4762974

Cite this

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title = "Conductor thickness based dispersion models of slot-line in",

abstract = "The CAD oriented closed-form model is presented to compute frequency dependent effective relative permittivity and characteristic impedance of a slot-line with finite conductor thickness in the range 3μm-50μw. The model has average accuracy of about 2% against the full- wave results from different sources in the frequency range 2GHz-60GHz, 222≤εr ≤20, 0.02≤w/h≤1.0, 0.01 ≤h/λ0≤0.25/ √(εr -1) The dielectric loss and conductor loss for slot lines have been computed and are found to be in excellent agreement with the practical and theoretical data available in the literature.",

keywords = "Conductor loss, Conductor thickness based propagation characteristics, Dielectric loss, Microwave/millimeter-wave technology, Slot-line",

author = "Lossy Media and P. Majumdar and Verma, {A. K.}",

year = "2008",

doi = "10.1109/AMTA.2008.4762974",

language = "English",

isbn = "9781424426904",

pages = "99--102",

booktitle = "2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008 ; Conference date: 21-11-2008 Through 24-11-2008",

}

Media, L, Majumdar, P & Verma, AK 2008, Conductor thickness based dispersion models of slot-line in. in 2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008., 4762974, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 99-102, 2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008, Jaipur, Rajasthan, India, 21/11/08. https://doi.org/10.1109/AMTA.2008.4762974

Conductor thickness based dispersion models of slot-line in. / Media, Lossy; Majumdar, P.; Verma, A. K.
2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2008. p. 99-102 4762974.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Conductor thickness based dispersion models of slot-line in

AU - Media, Lossy

AU - Majumdar, P.

AU - Verma, A. K.

PY - 2008

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N2 - The CAD oriented closed-form model is presented to compute frequency dependent effective relative permittivity and characteristic impedance of a slot-line with finite conductor thickness in the range 3μm-50μw. The model has average accuracy of about 2% against the full- wave results from different sources in the frequency range 2GHz-60GHz, 222≤εr ≤20, 0.02≤w/h≤1.0, 0.01 ≤h/λ0≤0.25/ √(εr -1) The dielectric loss and conductor loss for slot lines have been computed and are found to be in excellent agreement with the practical and theoretical data available in the literature.

AB - The CAD oriented closed-form model is presented to compute frequency dependent effective relative permittivity and characteristic impedance of a slot-line with finite conductor thickness in the range 3μm-50μw. The model has average accuracy of about 2% against the full- wave results from different sources in the frequency range 2GHz-60GHz, 222≤εr ≤20, 0.02≤w/h≤1.0, 0.01 ≤h/λ0≤0.25/ √(εr -1) The dielectric loss and conductor loss for slot lines have been computed and are found to be in excellent agreement with the practical and theoretical data available in the literature.

KW - Conductor loss

KW - Conductor thickness based propagation characteristics

KW - Dielectric loss

KW - Microwave/millimeter-wave technology

KW - Slot-line

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DO - 10.1109/AMTA.2008.4762974

M3 - Conference proceeding contribution

AN - SCOPUS:63049088778

SN - 9781424426904

SP - 99

EP - 102

BT - 2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008

Y2 - 21 November 2008 through 24 November 2008

ER -

Conductor thickness based dispersion models of slot-line in

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Keywords

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