Contactless photo-conductivity measurements using time-resolved microwave conductivity

Raheel M. Hashmi; Supriya Pillai

doi:10.1109/ICEAA.2019.8879191

Contactless photo-conductivity measurements using time-resolved microwave conductivity

Raheel M. Hashmi, Supriya Pillai

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

Microwave probing can be used to study the charge carrier dynamics in photo-conductive materials. Such studies are of paramount importance considering the significant efforts dedicated towards photo-voltaic energy generation now-a-days. Contactless methods to quantify the generation of charge carriers in film-based materials, under the influence of light of varying intensity, are much needed to enable screening of such materials to identify the most promising candidates [1]. We describe the use of time-resolved microwave conductivity (TRMC), which is an effective and contactless technique, to study the dynamics of charge carrier generation and recombination in thin film-based conductive media. In this work, we present numerical simulations carried out in CST Microwave Studio, and a practical microwave probe setup, to extend the TRMC technique for enabling new measurement capabilities. Such microwave-based probe setup can be used in-line with bulk-fabrication processes for evaluating quality of thin-film organic photo voltaic materials in real time.

Original language	English
Title of host publication	Proceedings of the 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)
Subtitle of host publication	ICEAA '19 21st edition
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1407
Number of pages	1
ISBN (Electronic)	9781728105635, 9781728105628
ISBN (Print)	9781728105642
DOIs	https://doi.org/10.1109/ICEAA.2019.8879191
Publication status	Published - 2019
Event	21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019 - Granada, Spain Duration: 9 Sept 2019 → 13 Sept 2019

Conference

Conference	21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019
Country/Territory	Spain
City	Granada
Period	9/09/19 → 13/09/19

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10.1109/ICEAA.2019.8879191

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title = "Contactless photo-conductivity measurements using time-resolved microwave conductivity",

abstract = "Microwave probing can be used to study the charge carrier dynamics in photo-conductive materials. Such studies are of paramount importance considering the significant efforts dedicated towards photo-voltaic energy generation now-a-days. Contactless methods to quantify the generation of charge carriers in film-based materials, under the influence of light of varying intensity, are much needed to enable screening of such materials to identify the most promising candidates [1]. We describe the use of time-resolved microwave conductivity (TRMC), which is an effective and contactless technique, to study the dynamics of charge carrier generation and recombination in thin film-based conductive media. In this work, we present numerical simulations carried out in CST Microwave Studio, and a practical microwave probe setup, to extend the TRMC technique for enabling new measurement capabilities. Such microwave-based probe setup can be used in-line with bulk-fabrication processes for evaluating quality of thin-film organic photo voltaic materials in real time.",

author = "Hashmi, {Raheel M.} and Supriya Pillai",

year = "2019",

doi = "10.1109/ICEAA.2019.8879191",

language = "English",

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pages = "1407",

booktitle = "Proceedings of the 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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note = "21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019 ; Conference date: 09-09-2019 Through 13-09-2019",

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Hashmi, RM & Pillai, S 2019, Contactless photo-conductivity measurements using time-resolved microwave conductivity. in Proceedings of the 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA): ICEAA '19 21st edition. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1407, 21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019, Granada, Spain, 9/09/19. https://doi.org/10.1109/ICEAA.2019.8879191

Contactless photo-conductivity measurements using time-resolved microwave conductivity. / Hashmi, Raheel M.; Pillai, Supriya.
Proceedings of the 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA): ICEAA '19 21st edition. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2019. p. 1407.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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AU - Pillai, Supriya

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AB - Microwave probing can be used to study the charge carrier dynamics in photo-conductive materials. Such studies are of paramount importance considering the significant efforts dedicated towards photo-voltaic energy generation now-a-days. Contactless methods to quantify the generation of charge carriers in film-based materials, under the influence of light of varying intensity, are much needed to enable screening of such materials to identify the most promising candidates [1]. We describe the use of time-resolved microwave conductivity (TRMC), which is an effective and contactless technique, to study the dynamics of charge carrier generation and recombination in thin film-based conductive media. In this work, we present numerical simulations carried out in CST Microwave Studio, and a practical microwave probe setup, to extend the TRMC technique for enabling new measurement capabilities. Such microwave-based probe setup can be used in-line with bulk-fabrication processes for evaluating quality of thin-film organic photo voltaic materials in real time.

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BT - Proceedings of the 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)

PB - Institute of Electrical and Electronics Engineers (IEEE)

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ER -

Contactless photo-conductivity measurements using time-resolved microwave conductivity

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