Control of surface reflection phase by multiple embedded width-modulated microstrip resonators

Yogesh Ranga, Ladislau Matekovits, Stuart G. Hay, Trevor S. Bird

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

The scattering characteristic of normally incident electromagnetic waves from a multiple stacked width modulated microstrip High Impedance Surface (HIS) is investigated. The unit cell is formed by stacking together three, width-modulated microstrip line based unit cells. Parameter values in terms of modulation width in individual cells are changed to characterize the phase reflective device exhibiting advanced controlling features of the observable in a specific wide frequency band. The reflections from stacked structures formed using different modulated but similar unit cells are compared with the reflection from a truly periodic structure consisting of identical unit cells. The effect of the modulation on different layers is discussed. The proposed solution enables efficient control of the reflection phase and hence suggests the configuration for reflectarrays and/or holographic surfaces.

Original languageEnglish
Title of host publication2013 7th European Conference on Antennas and Propagation, EuCAP 2013
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages2408-2410
Number of pages3
ISBN (Print)9788890701832
Publication statusPublished - 2013
Externally publishedYes
Event2013 7th European Conference on Antennas and Propagation, EuCAP 2013 - Gothenburg, Sweden
Duration: 8 Apr 201312 Apr 2013

Other

Other2013 7th European Conference on Antennas and Propagation, EuCAP 2013
CountrySweden
CityGothenburg
Period8/04/1312/04/13

Fingerprint Dive into the research topics of 'Control of surface reflection phase by multiple embedded width-modulated microstrip resonators'. Together they form a unique fingerprint.

Cite this