TY - CHAP
T1 - Core model for independent multigate MOSFETs
AU - Duarte, Juan Pablo
AU - Khandelwal, Sourabh
AU - Chang, Huan-Lin
AU - Lin, Yen-Kai
AU - Kushwaha, Pragya
AU - Chauhan, Yogesh Singh
AU - Hu, Chenming
PY - 2019
Y1 - 2019
N2 - This chapter presents the core model for the industry standard compact
model BSIM-IMG, a fully featured turn-key compact model for independent
multigate MOSFETs. The two independent (front and back gates) controls
of the channel charge in these devices enable novel applications wherein
the back gate can be in depletion or inversion, and BSIM-IMG accurately
models these scenarios. Modeling of the channel charge in this device
requires a consistent solution of coupled Poisson’s equations at the
front and the back gate. This chapter presents an analytical solution
for the Poisson’s equation which is numerically robust and passes
important quality tests for an industry grade compact model. To
represent real device effects, several extra models are later
incorporated, such as drain-induced barrier lowering, velocity
saturation, short-channel effects, self-heating effect, mobility-field
dependence, and substrate-depletion effect.
AB - This chapter presents the core model for the industry standard compact
model BSIM-IMG, a fully featured turn-key compact model for independent
multigate MOSFETs. The two independent (front and back gates) controls
of the channel charge in these devices enable novel applications wherein
the back gate can be in depletion or inversion, and BSIM-IMG accurately
models these scenarios. Modeling of the channel charge in this device
requires a consistent solution of coupled Poisson’s equations at the
front and the back gate. This chapter presents an analytical solution
for the Poisson’s equation which is numerically robust and passes
important quality tests for an industry grade compact model. To
represent real device effects, several extra models are later
incorporated, such as drain-induced barrier lowering, velocity
saturation, short-channel effects, self-heating effect, mobility-field
dependence, and substrate-depletion effect.
UR - http://www.scopus.com/inward/record.url?scp=85080812750&partnerID=8YFLogxK
U2 - 10.1016/B978-0-08-102401-0.00002-9
DO - 10.1016/B978-0-08-102401-0.00002-9
M3 - Chapter
AN - SCOPUS:85080812750
SN - 9780081024010
T3 - Woodhead Publishing Series in Electronic and Optical Materials
SP - 15
EP - 34
BT - Industry standard FDSOI compact model BSIM-IMG for IC design
A2 - Hu, Chenming
A2 - Khandelwal, Sourabh
A2 - Chauhan, Yogesh Singh
A2 - Mckay, Thomas
A2 - Watts, Josef
A2 - Duarte, Juan Pablo
A2 - Kushwaha, Pragya
A2 - Agarwal, Harshit
PB - Elsevier
CY - Duxford ; Cambridge, US ; Kidlington
ER -