Cryogenic sapphire oscillator using a low- vibration design pulse-tube cryocooler: First results

John G. Hartnett; Nitin R. Nand; Chao Wang; Jean Michel Le Floch

doi:10.1109/TUFFC.2010.1515

Cryogenic sapphire oscillator using a low- vibration design pulse-tube cryocooler: First results

John G. Hartnett, Nitin R. Nand, Chao Wang, Jean Michel Le Floch

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

A cryogenic sapphire oscillator (CSO) has been implemented at 11.2 GHz using a low-vibration design pulsetube cryocooler. Compared with a state-of-the-art liquid helium cooled CSO in the same laboratory, the square root Allan variance of their combined fractional frequency instability is σ_y = 1.4 × 10^-15τ_-1/2 for integration times 1 < τ < 10 s, dominated by white frequency noise. The minimum σ_y = 5.3 × 10^-16 for the two oscillators was reached at τ = 20 s. Assuming equal contributions from both CSOs, the single oscillator phase noise S_φ -96 dB.rad ²/Hz at 1 Hz set from the carrier.

Original language	English
Article number	5456252
Pages (from-to)	1034-1038
Number of pages	5
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	57
Issue number	5
DOIs	https://doi.org/10.1109/TUFFC.2010.1515
Publication status	Published - May 2010

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abstract = "A cryogenic sapphire oscillator (CSO) has been implemented at 11.2 GHz using a low-vibration design pulsetube cryocooler. Compared with a state-of-the-art liquid helium cooled CSO in the same laboratory, the square root Allan variance of their combined fractional frequency instability is σy = 1.4 × 10-15τ-1/2 for integration times 1 < τ < 10 s, dominated by white frequency noise. The minimum σy = 5.3 × 10-16 for the two oscillators was reached at τ = 20 s. Assuming equal contributions from both CSOs, the single oscillator phase noise Sφ -96 dB.rad 2/Hz at 1 Hz set from the carrier.",

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AU - Le Floch, Jean Michel

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AB - A cryogenic sapphire oscillator (CSO) has been implemented at 11.2 GHz using a low-vibration design pulsetube cryocooler. Compared with a state-of-the-art liquid helium cooled CSO in the same laboratory, the square root Allan variance of their combined fractional frequency instability is σy = 1.4 × 10-15τ-1/2 for integration times 1 < τ < 10 s, dominated by white frequency noise. The minimum σy = 5.3 × 10-16 for the two oscillators was reached at τ = 20 s. Assuming equal contributions from both CSOs, the single oscillator phase noise Sφ -96 dB.rad 2/Hz at 1 Hz set from the carrier.

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Cryogenic sapphire oscillator using a low- vibration design pulse-tube cryocooler: First results

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