Abstract
We analyse phase matching characteristics and nonlinear conversion in the self-frequency doubling material Yb:YAB and demonstrate a simple non-destructive technique for measuring crystal quality. By imaging the nonlinear conversion using a CCD camera we observe phase matching characteristics similar to that obtained in quasiphase- matched crystals and attribute these effects to twin inversion defects induced during crystal growth.
| Original language | English |
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| Title of host publication | Photorefractive Effects, Materials, and Devices, PEMD 2005 |
| Subtitle of host publication | Material Preparation and Characterization: Inorganic (MPCI) |
| Place of Publication | Washington, DC |
| Publisher | Optical Society of America (OSA) |
| Pages | 267-271 |
| Number of pages | 5 |
| ISBN (Print) | 1557527938, 9781557527936 |
| Publication status | Published - May 2005 |
| Event | Photorefractive Effects, Materials, and Devices, PEMD - 2005 - Sanya, China Duration: 19 Jul 2005 → 19 Jul 2005 |
Other
| Other | Photorefractive Effects, Materials, and Devices, PEMD - 2005 |
|---|---|
| Country/Territory | China |
| City | Sanya |
| Period | 19/07/05 → 19/07/05 |