DAGAD: Data Augmentation for Graph Anomaly Detection

Fanzhen Liu, Xiaoxiao Ma, Jia Wu*, Jian Yang, Shan Xue, Amin Beheshti, Chuan Zhou, Hao Peng, Quan Z. Sheng, Charu C. Aggarwal

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

34 Citations (Scopus)

Abstract

Graph anomaly detection in this paper aims to distinguish abnormal nodes that behave differently from the benign ones accounting for the majority of graph-structured instances. Receiving increasing attention from both academia and industry, yet existing research on this task still suffers from two critical issues when learning informative anomalous behavior from graph data. For one thing, anomalies are usually hard to capture because of their subtle abnormal behavior and the shortage of background knowledge about them, which causes severe anomalous sample scarcity. Meanwhile, the overwhelming majority of objects in real-world graphs are normal, bringing the class imbalance problem as well. To bridge the gaps, this paper devises a novel Data Augmentation-based Graph Anomaly Detection (DAGAD) framework for attributed graphs, equipped with three specially designed modules: 1) an information fusion module employing graph neural network encoders to learn representations, 2) a graph data augmentation module that fertilizes the training set with generated samples, and 3) an imbalance-tailored learning module to discriminate the distributions of the minority (anomalous) and majority (normal) classes. A series of experiments on three datasets prove that DAGAD outperforms ten state-of-the-art baseline detectors concerning various mostly-used metrics, together with an extensive ablation study validating the strength of our proposed modules.

Original languageEnglish
Title of host publication22nd IEEE International Conference on Data Mining ICDM 2022
Subtitle of host publicationproceedings
EditorsXingquan Zhu, Sanjay Ranka, My T. Thai, Takashi Washio, Xindong Wu
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages259-268
Number of pages10
ISBN (Electronic)9781665450997
ISBN (Print)9781665451000
DOIs
Publication statusPublished - 2022
Event22nd IEEE International Conference on Data Mining, ICDM 2022 - Orlando, United States
Duration: 28 Nov 20221 Dec 2022

Publication series

Name
ISSN (Print)1550-4786
ISSN (Electronic)2374-8486

Conference

Conference22nd IEEE International Conference on Data Mining, ICDM 2022
Country/TerritoryUnited States
CityOrlando
Period28/11/221/12/22

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