Dark field optical tweezers for studying nanoparticle dynamics

W. J. Toe; K. Pearce; F. Wang; P. J. Reece

doi:10.1109/COMMAD.2012.6472381

Dark field optical tweezers for studying nanoparticle dynamics

W. J. Toe, K. Pearce, F. Wang, P. J. Reece^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

We report a method of characterising physical and optical properties of nanoparticles using optical tweezers combined with dark field microscopy. The technique uses measurements from Brownian dynamics of the trapped nanoparticles to determine localised surface plasmon resonance (LSPR) spectroscopy to determine nanoparticle size information.

Original language	English
Title of host publication	2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	103-104
Number of pages	2
ISBN (Electronic)	9781467330466
ISBN (Print)	9781467330459
DOIs	https://doi.org/10.1109/COMMAD.2012.6472381
Publication status	Published - 2012
Event	2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Melbourne, VIC, Australia Duration: 12 Dec 2012 → 14 Dec 2012

Other

Other	2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012
Country/Territory	Australia
City	Melbourne, VIC
Period	12/12/12 → 14/12/12

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10.1109/COMMAD.2012.6472381

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title = "Dark field optical tweezers for studying nanoparticle dynamics",

abstract = "We report a method of characterising physical and optical properties of nanoparticles using optical tweezers combined with dark field microscopy. The technique uses measurements from Brownian dynamics of the trapped nanoparticles to determine localised surface plasmon resonance (LSPR) spectroscopy to determine nanoparticle size information.",

author = "Toe, {W. J.} and K. Pearce and F. Wang and Reece, {P. J.}",

year = "2012",

doi = "10.1109/COMMAD.2012.6472381",

language = "English",

isbn = "9781467330459",

pages = "103--104",

booktitle = "2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 ; Conference date: 12-12-2012 Through 14-12-2012",

}

Toe, WJ, Pearce, K, Wang, F & Reece, PJ 2012, Dark field optical tweezers for studying nanoparticle dynamics. in 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings., 6472381, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 103-104, 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012, Melbourne, VIC, Australia, 12/12/12. https://doi.org/10.1109/COMMAD.2012.6472381

Dark field optical tweezers for studying nanoparticle dynamics. / Toe, W. J.; Pearce, K.; Wang, F. et al.
2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2012. p. 103-104 6472381.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Dark field optical tweezers for studying nanoparticle dynamics

AU - Toe, W. J.

AU - Pearce, K.

AU - Wang, F.

AU - Reece, P. J.

PY - 2012

Y1 - 2012

N2 - We report a method of characterising physical and optical properties of nanoparticles using optical tweezers combined with dark field microscopy. The technique uses measurements from Brownian dynamics of the trapped nanoparticles to determine localised surface plasmon resonance (LSPR) spectroscopy to determine nanoparticle size information.

AB - We report a method of characterising physical and optical properties of nanoparticles using optical tweezers combined with dark field microscopy. The technique uses measurements from Brownian dynamics of the trapped nanoparticles to determine localised surface plasmon resonance (LSPR) spectroscopy to determine nanoparticle size information.

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U2 - 10.1109/COMMAD.2012.6472381

DO - 10.1109/COMMAD.2012.6472381

M3 - Conference proceeding contribution

AN - SCOPUS:84875587707

SN - 9781467330459

SP - 103

EP - 104

BT - 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012

Y2 - 12 December 2012 through 14 December 2012

ER -

Dark field optical tweezers for studying nanoparticle dynamics

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