De-embedding system noise from two-channel low-frequency noise measurements

Oya Sevimli, Anthony E. Parker, Simon J. Mahon, Anthony P. Fattorini

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.

Original languageEnglish
Title of host publication2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-4
Number of pages4
ISBN (Electronic)9781479906710, 9781479906703
ISBN (Print)9781479906680
DOIs
Publication statusPublished - 16 Aug 2013
Event2013 22nd International Conference on Noise and Fluctuations, ICNF 2013 - Montpellier, France
Duration: 24 Jun 201328 Jun 2013

Other

Other2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
CountryFrance
CityMontpellier
Period24/06/1328/06/13

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