De-embedding system noise from two-channel low-frequency noise measurements

Oya Sevimli; Anthony E. Parker; Simon J. Mahon; Anthony P. Fattorini

doi:10.1109/ICNF.2013.6579002

De-embedding system noise from two-channel low-frequency noise measurements

Oya Sevimli, Anthony E. Parker, Simon J. Mahon, Anthony P. Fattorini

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.

Original language	English
Title of host publication	2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	1-4
Number of pages	4
ISBN (Electronic)	9781479906710, 9781479906703
ISBN (Print)	9781479906680
DOIs	https://doi.org/10.1109/ICNF.2013.6579002
Publication status	Published - 16 Aug 2013
Event	2013 22nd International Conference on Noise and Fluctuations, ICNF 2013 - Montpellier, France Duration: 24 Jun 2013 → 28 Jun 2013

Other

Other	2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Country/Territory	France
City	Montpellier
Period	24/06/13 → 28/06/13

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10.1109/ICNF.2013.6579002

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title = "De-embedding system noise from two-channel low-frequency noise measurements",

abstract = "Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.",

author = "Oya Sevimli and Parker, \{Anthony E.\} and Mahon, \{Simon J.\} and Fattorini, \{Anthony P.\}",

year = "2013",

month = aug,

day = "16",

doi = "10.1109/ICNF.2013.6579002",

language = "English",

isbn = "9781479906680",

pages = "1--4",

booktitle = "2013 22nd International Conference on Noise and Fluctuations, ICNF 2013",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "2013 22nd International Conference on Noise and Fluctuations, ICNF 2013 ; Conference date: 24-06-2013 Through 28-06-2013",

}

Sevimli, O, Parker, AE, Mahon, SJ & Fattorini, AP 2013, De-embedding system noise from two-channel low-frequency noise measurements. in 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013., 6579002, Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 1-4, 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013, Montpellier, France, 24/06/13. https://doi.org/10.1109/ICNF.2013.6579002

De-embedding system noise from two-channel low-frequency noise measurements. / Sevimli, Oya; Parker, Anthony E.; Mahon, Simon J. et al.
2013 22nd International Conference on Noise and Fluctuations, ICNF 2013. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2013. p. 1-4 6579002.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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T1 - De-embedding system noise from two-channel low-frequency noise measurements

AU - Sevimli, Oya

AU - Parker, Anthony E.

AU - Mahon, Simon J.

AU - Fattorini, Anthony P.

PY - 2013/8/16

Y1 - 2013/8/16

N2 - Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.

AB - Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.

UR - https://www.scopus.com/pages/publications/84883700468

U2 - 10.1109/ICNF.2013.6579002

DO - 10.1109/ICNF.2013.6579002

M3 - Conference proceeding contribution

AN - SCOPUS:84883700468

SN - 9781479906680

SP - 1

EP - 4

BT - 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013

Y2 - 24 June 2013 through 28 June 2013

ER -

De-embedding system noise from two-channel low-frequency noise measurements

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