Deep optimal isolation forest with genetic algorithm for anomaly detection

Haolong Xiang, Xuyun Zhang, Mark Dras, Amin Beheshti, Wanchun Dou, Xiaolong Xu

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

8 Citations (Scopus)

Abstract

Anomaly detection is one of the crucial research topics in artificial intelligence, encompassing various fields such as health monitoring, network intrusion detection, and fraud detection in financial transactions. Deep anomaly detection (DAD) methods are considered as the effective approaches for addressing complex anomaly detection problems. Among them, the deep isolation forest methods have gained rapid development recently due to their simplicity in parameter turning and efficiency in model training. The existing deep isolation forest approaches are all based on representation learning, while OptiForest theoretically proves the crucial role of the tree structure in isolation forest based methods. In this paper, we analyse the search space of isolation trees under specific data instances and address the challenges in finding optimal isolation forest. Based on the theoretical underpinning and genetic algorithm, we design a deep model DOIForest with two mutation schemes and solution selection, which learns the optimal isolation forest and optimises the parameters in data partitioning. Extensive experiments on both synthetic dataset and a series of real-world datasets demonstrate that our approach can achieve better detection accuracy and robustness than the state-of-the-arts.

Original languageEnglish
Title of host publication23rd IEEE International Conference on Data Mining ICDM 2023
Subtitle of host publicationproceedings
EditorsGuihai Chen, Latifur Khan, Xiaofeng Gao, Meikang Qiu, Witold Pedrycz, Xindong Wu
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages678-687
Number of pages10
ISBN (Electronic)9798350307887
ISBN (Print)9798350307894
DOIs
Publication statusPublished - 2023
Event23rd IEEE International Conference on Data Mining, ICDM 2023 - Shanghai, China
Duration: 1 Dec 20234 Dec 2023

Publication series

Name
ISSN (Print)1550-478
ISSN (Electronic)2374-8486

Conference

Conference23rd IEEE International Conference on Data Mining, ICDM 2023
Country/TerritoryChina
CityShanghai
Period1/12/234/12/23

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