Defect-mediated Z-scheme carriers’ dynamics of C-ZnO/A-CN toward highly enhanced photocatalytic TC degradation

Xiaoyan Huang, Xiuyun Zhang, Kexiang Zhang, Xiaogang Xue*, Jian Xiong, Yu Huang, Doudou Zhang, Jian Zhang*, Zheling Zhang, Fengpo Yan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)

Abstract

Constructing Z-scheme photocatalysts is a promising strategy to improve the photocatalytic performance of materials, wherein carriers’ recombination plays a critical role by tuning carrier transportation and separation. In this study, a defect mediated layered heterojunction of amorphous carbon nitride (A-CN) and carbon doped ZnO (C-ZnO) are designed by calcination of ZIF-8 immersed urea. TEM and SEM elucidate the 2D heterojunctions coupled C-ZnO with a sheet-like A-CN that was formed. FTIR and XPS confirm the existence –N–C[tbnd]N and –N[dbnd]C[dbnd]N– groups interacted with C-ZnO. The defect-mediated C-ZnO/A-CN with 75% A-CN exhibited the highest tetracycline hydrochloride (TC) degradation rate, ~7.7, 3.0 and 7.7 times that of ZnO, loaded ZnO+CN or CN, respectively. Transient PL and photochemical characterizations revealed that defects assisted carriers’ recombination leads to a strong Z-scheme interfacial charge transfer and more reactive centers for TC degradation. This work would provide a new insight for the design of Z-scheme photocatalysts for the removal of pollutants.

Original languageEnglish
Article number160321
Pages (from-to)1-12
Number of pages12
JournalJournal of Alloys and Compounds
Volume877
DOIs
Publication statusPublished - 5 Oct 2021
Externally publishedYes

Keywords

  • Defect mediated Z-scheme
  • Interfacial interaction
  • Photocatalytic TC degradation
  • Synergistic effect

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