Demonstration of a linear of tics controlled-NOT gate

G. J. Pryde; J. L. O'Brien; A. Gilchrist; N. K. Laragford; A. G. White; T. C. Ralph; D. F V James; B. Branning

Demonstration of a linear of tics controlled-NOT gate

G. J. Pryde^*, J. L. O'Brien, A. Gilchrist, N. K. Laragford, A. G. White, T. C. Ralph, D. F V James, B. Branning

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

We experimentally demonstrate an all-optical quantum gate that, with high fidelity, reproduces the entanglement and truth table of a controlled-NOT. We completely characterize it using quantum process tomography, obtaining an average process fidelity of 0.81.

Original language	English
Pages (from-to)	395-396
Number of pages	2
Journal	OSA Trends in Optics and Photonics Series
Volume	97
Publication status	Published - 2004
Externally published	Yes

Cite this

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title = "Demonstration of a linear of tics controlled-NOT gate",

abstract = "We experimentally demonstrate an all-optical quantum gate that, with high fidelity, reproduces the entanglement and truth table of a controlled-NOT. We completely characterize it using quantum process tomography, obtaining an average process fidelity of 0.81.",

author = "Pryde, {G. J.} and O'Brien, {J. L.} and A. Gilchrist and Laragford, {N. K.} and White, {A. G.} and Ralph, {T. C.} and James, {D. F V} and B. Branning",

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T1 - Demonstration of a linear of tics controlled-NOT gate

AU - Pryde, G. J.

AU - O'Brien, J. L.

AU - Gilchrist, A.

AU - Laragford, N. K.

AU - White, A. G.

AU - Ralph, T. C.

AU - James, D. F V

AU - Branning, B.

PY - 2004

Y1 - 2004

N2 - We experimentally demonstrate an all-optical quantum gate that, with high fidelity, reproduces the entanglement and truth table of a controlled-NOT. We completely characterize it using quantum process tomography, obtaining an average process fidelity of 0.81.

AB - We experimentally demonstrate an all-optical quantum gate that, with high fidelity, reproduces the entanglement and truth table of a controlled-NOT. We completely characterize it using quantum process tomography, obtaining an average process fidelity of 0.81.

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M3 - Article

AN - SCOPUS:33645243082

SN - 1094-5695

VL - 97

SP - 395

EP - 396

JO - OSA Trends in Optics and Photonics Series

JF - OSA Trends in Optics and Photonics Series

ER -

Demonstration of a linear of tics controlled-NOT gate

Abstract

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