Determination of active doping in highly resistive boron doped silicon nanocrystals embedded in SiO2 by capacitance voltage measurement on inverted metal oxide semiconductor structure

Tian Zhang*, Binesh Puthen-Veettil, Lingfeng Wu, Xuguang Jia, Ziyun Lin, Terry Chien-Jen Yang, Gavin Conibeer, Ivan Perez-Wurfl

*Corresponding author for this work

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11 Citations (Scopus)

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Physics & Astronomy