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Determination of azimuth angle, incidence angle, and contact-potential difference for low-energy electron-diffraction fine-structure measurements
G. Hitchen
*
, S. Thurgate
*
Corresponding author for this work
Research output
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Contribution to journal
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Article
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peer-review
13
Citations (Scopus)
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Dive into the research topics of 'Determination of azimuth angle, incidence angle, and contact-potential difference for low-energy electron-diffraction fine-structure measurements'. Together they form a unique fingerprint.
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Physics & Astronomy
contact potentials
59%
azimuth
49%
electron diffraction
38%
fine structure
37%
incidence
36%
electron trajectories
14%
energy
13%
vacuum systems
13%
optical paths
11%
confidence
10%
electron beams
8%
magnetic fields
5%
crystals
5%
Engineering & Materials Science
Low energy electron diffraction
100%
Electrons
45%
Electron beams
26%
Crystals
22%
Vacuum
19%
Magnetic fields
19%
Uncertainty
14%
Chemistry
Low Energy Electron Diffraction
58%
Electron Beam
24%
Electron Particle
24%
Magnetic Field
20%
Vacuum
17%
Surface
7%