Determination of conductor loss of multilayer-coupled microstrip lines for CAD application

A. K. Verma*, Nasimuddin

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer-coupled microstrip line with and without shield. The accuracy of the method has been tested against several full-wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth.

Original languageEnglish
Pages (from-to)409-415
Number of pages7
JournalMicrowave and Optical Technology Letters
Volume38
Issue number5
DOIs
Publication statusPublished - 5 Sep 2003
Externally publishedYes

Keywords

  • Conductor loss
  • Coupled microstrip lines
  • Multilayer dielectric

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