Determination of conductor loss of multilayer-coupled microstrip lines for CAD application

A. K. Verma; Nasimuddin

doi:10.1002/mop.11076

Determination of conductor loss of multilayer-coupled microstrip lines for CAD application

A. K. Verma^*, Nasimuddin

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer-coupled microstrip line with and without shield. The accuracy of the method has been tested against several full-wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth.

Original language	English
Pages (from-to)	409-415
Number of pages	7
Journal	Microwave and Optical Technology Letters
Volume	38
Issue number	5
DOIs	https://doi.org/10.1002/mop.11076
Publication status	Published - 5 Sept 2003
Externally published	Yes

Keywords

Conductor loss
Coupled microstrip lines
Multilayer dielectric

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10.1002/mop.11076

Cite this

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abstract = "By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer-coupled microstrip line with and without shield. The accuracy of the method has been tested against several full-wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth.",

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N2 - By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer-coupled microstrip line with and without shield. The accuracy of the method has been tested against several full-wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth.

AB - By modifying and adopting the incremental inductance rule, in association with the variational method in the Fourier domain, and using the single layer (SLR) formulation, we present a fast and accurate method to compute the conductor loss of a multilayer-coupled microstrip line with and without shield. The accuracy of the method has been tested against several full-wave methods. The conductor loss of many useful structures is compared. The method is valid for conductor thickness t > 1.11 skin depth.

KW - Conductor loss

KW - Coupled microstrip lines

KW - Multilayer dielectric

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JF - Microwave and Optical Technology Letters

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Determination of conductor loss of multilayer-coupled microstrip lines for CAD application

Abstract

Keywords

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