Determination of dielectric constant and loss-tangent of substrate sheet using microstrip patch resonator

A. K. Verma*, Nasimuddin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

This paper presents a new microstrip rectangular patch resonator based method to determine the dielectric constant and the loss tangent of a dielectric material in sheet form. Using an improved form of the cavity model, called the modified Wolff model (MWM), the present method extracts these two parameters from the measured resonance frequency and Q-factor. The MWM takes care of all kind of losses in the patch, resulting in accurate determination of the dielectric constant and loss tangent of the substrate.

Original languageEnglish
Pages (from-to)175-179
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume35
Issue number3
DOIs
Publication statusPublished - 5 Nov 2002
Externally publishedYes

Keywords

  • Dielectric constant
  • Loss-tangent
  • MIC substrate
  • Microstrip patch

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