Determination of the surface-potential barrier of Cu(001) from low-energy-electron-diffraction fine structure

G. J. Hitchen*, S. M. Thurgate, P. J. Jennings

*Corresponding author for this work

    Research output: Contribution to journalArticle

    17 Citations (Scopus)

    Abstract

    The surface-potential barrier shape for the (001) face of copper was determined by an analysis of low-energy-electron-diffraction fine-structure measurements. The fitting of the fine-structure spectra was performed with a precise knowledge of the incident diffraction conditions of the experimental data (incidence angle, azimuthal angle, and contact-potential difference). This precision is necessary to allow a consistent barrier shape to be determined. For three different angles of incidence, it was found that a good match between theoretical and experimental I-V spectra was obtained when the image plane was located 2.5 a.u. from the topmost layer of atoms.

    Original languageEnglish
    Pages (from-to)3939-3942
    Number of pages4
    JournalPhysical Review B
    Volume44
    Issue number8
    DOIs
    Publication statusPublished - 1991

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