Abstract
The development work of a novel planar mesh type micro-magnetic sensor for the quality inspection of electroplated materials has been reported in this paper. The sensor has the possibility of inspecting the quality of electroplated materials. The results obtained from the analytical model for the calculation of transfer impedance of the sensor has been discussed. The transfer impedance is used for the quality inspection of electroplated materials in an indirect way. The experimental results are reported which confirm the validity of the analytical model.
Original language | English |
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Title of host publication | Proceedings of IEEE Sensors 2002 |
Subtitle of host publication | the first IEEE international conference on sensors |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 741-746 |
Number of pages | 6 |
Volume | 1 |
Edition | 2 |
Publication status | Published - 2002 |
Externally published | Yes |
Event | First IEEE International Conference on Sensors - IEEE Sensors 2002 - Orlando, FL, United States Duration: 12 Jun 2002 → 14 Jun 2002 |
Other
Other | First IEEE International Conference on Sensors - IEEE Sensors 2002 |
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Country/Territory | United States |
City | Orlando, FL |
Period | 12/06/02 → 14/06/02 |
Keywords
- Electroplated material
- Meander and mesh configuration
- Nondestructive evaluation technique
- Planar type sensors
- Transfer impedance