Device characterization for distortion prediction including memory effects

James Brinkhoff*, Anthony E. Parker

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    A low-frequency nonlinear two-port characterization system is described and methods are developed to allow the automatic extraction of device and circuit parameters necessary for intermodulation prediction including memory effects. Nonlinear characterization has been achieved up to fifth-order.

    Original languageEnglish
    Pages (from-to)171-173
    Number of pages3
    JournalIEEE Microwave and Wireless Components Letters
    Volume15
    Issue number3
    DOIs
    Publication statusPublished - Mar 2005

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