Device characterization for distortion prediction including memory effects

James Brinkhoff*, Anthony E. Parker

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A low-frequency nonlinear two-port characterization system is described and methods are developed to allow the automatic extraction of device and circuit parameters necessary for intermodulation prediction including memory effects. Nonlinear characterization has been achieved up to fifth-order.

Original languageEnglish
Pages (from-to)171-173
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume15
Issue number3
DOIs
Publication statusPublished - Mar 2005

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