Abstract
A low-frequency nonlinear two-port characterization system is described and methods are developed to allow the automatic extraction of device and circuit parameters necessary for intermodulation prediction including memory effects. Nonlinear characterization has been achieved up to fifth-order.
Original language | English |
---|---|
Pages (from-to) | 171-173 |
Number of pages | 3 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 15 |
Issue number | 3 |
DOIs | |
Publication status | Published - Mar 2005 |