Abstract
The non-linearity demonstrated by a circuit is a function of the device nonlinearity, its parasitic components and the circuit components in which it is embedded. We demonstrate that the common source stage, which is used extensively for Device Characterization, presents a very complex form of Device-Circuit Interaction, which makes reliable extraction of its intrinsic non-linear parameters extremely difficult. We show how pulse measurements can provide a straight forward access to parameters needed for Volterra Analysis and show the true nature of output conductance.
| Original language | English |
|---|---|
| Pages (from-to) | 241-244 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 5 |
| Publication status | Published - 1994 |
| Externally published | Yes |