Device circuit interaction in the common source amplifier

D. R. Webster*, A. E. Parker, D. G. Haigh, P. M. Radmore

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The non-linearity demonstrated by a circuit is a function of the device nonlinearity, its parasitic components and the circuit components in which it is embedded. We demonstrate that the common source stage, which is used extensively for Device Characterization, presents a very complex form of Device-Circuit Interaction, which makes reliable extraction of its intrinsic non-linear parameters extremely difficult. We show how pulse measurements can provide a straight forward access to parameters needed for Volterra Analysis and show the true nature of output conductance.

Original languageEnglish
Pages (from-to)241-244
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume5
Publication statusPublished - 1994
Externally publishedYes

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