Dielectric parameter estimation at Ka-band using Bayesian inversion method

Saleem Shahid; G. Guido Gentili; Giancarlo Bernasconi; Syed Muzahir Abbas; Kapal Dev

doi:10.1109/IEEECONF35879.2020.9329486

Dielectric parameter estimation at Ka-band using Bayesian inversion method

Saleem Shahid, G. Guido Gentili, Giancarlo Bernasconi, Syed Muzahir Abbas, Kapal Dev

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.

Original language	English
Title of host publication	2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting
Subtitle of host publication	proceedings
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	717-718
Number of pages	2
ISBN (Electronic)	9781728166704, 9781728166698
ISBN (Print)	9781728166711
DOIs	https://doi.org/10.1109/IEEECONF35879.2020.9329486
Publication status	Published - 2020
Event	2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting - Virtually, Toronto, Canada Duration: 5 Jul 2020 → 10 Jul 2020

Publication series

Name
ISSN (Print)	1522-3965
ISSN (Electronic)	1947-1491

Conference

Conference	2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting
Abbreviated title	IEEECONF 2020
Country/Territory	Canada
City	Virtually, Toronto
Period	5/07/20 → 10/07/20

Access to Document

10.1109/IEEECONF35879.2020.9329486

Cite this

Shahid, S., Gentili, G. G., Bernasconi, G., Abbas, S. M., & Dev, K. (2020). Dielectric parameter estimation at Ka-band using Bayesian inversion method. In 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting: proceedings (pp. 717-718). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IEEECONF35879.2020.9329486

@inproceedings{fc463caa446042308112c5eec79a6af5,

title = "Dielectric parameter estimation at Ka-band using Bayesian inversion method",

abstract = "This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.",

author = "Saleem Shahid and Gentili, {G. Guido} and Giancarlo Bernasconi and Abbas, {Syed Muzahir} and Kapal Dev",

year = "2020",

doi = "10.1109/IEEECONF35879.2020.9329486",

language = "English",

isbn = "9781728166711",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

pages = "717--718",

booktitle = "2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting",

address = "United States",

note = "2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting, IEEECONF 2020 ; Conference date: 05-07-2020 Through 10-07-2020",

}

Shahid, S, Gentili, GG, Bernasconi, G, Abbas, SM & Dev, K 2020, Dielectric parameter estimation at Ka-band using Bayesian inversion method. in 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting: proceedings. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, NJ, pp. 717-718, 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting, Virtually, Toronto, Ontario, Canada, 5/07/20. https://doi.org/10.1109/IEEECONF35879.2020.9329486

Dielectric parameter estimation at Ka-band using Bayesian inversion method. / Shahid, Saleem; Gentili, G. Guido; Bernasconi, Giancarlo et al.
2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting: proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2020. p. 717-718.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Dielectric parameter estimation at Ka-band using Bayesian inversion method

AU - Shahid, Saleem

AU - Gentili, G. Guido

AU - Bernasconi, Giancarlo

AU - Abbas, Syed Muzahir

AU - Dev, Kapal

PY - 2020

Y1 - 2020

N2 - This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.

AB - This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.

UR - http://www.scopus.com/inward/record.url?scp=85101634713&partnerID=8YFLogxK

U2 - 10.1109/IEEECONF35879.2020.9329486

DO - 10.1109/IEEECONF35879.2020.9329486

M3 - Conference proceeding contribution

AN - SCOPUS:85101634713

SN - 9781728166711

SP - 717

EP - 718

BT - 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting

PB - Institute of Electrical and Electronics Engineers (IEEE)

CY - Piscataway, NJ

T2 - 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting

Y2 - 5 July 2020 through 10 July 2020

ER -

Shahid S, Gentili GG, Bernasconi G, Abbas SM, Dev K. Dielectric parameter estimation at Ka-band using Bayesian inversion method. In 2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting: proceedings. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). 2020. p. 717-718 doi: 10.1109/IEEECONF35879.2020.9329486

Dielectric parameter estimation at Ka-band using Bayesian inversion method

Abstract

Publication series

Conference

Access to Document

Other files and links

Fingerprint

Cite this