Dielectric parameter estimation at Ka-band using Bayesian inversion method

Saleem Shahid, G. Guido Gentili, Giancarlo Bernasconi, Syed Muzahir Abbas, Kapal Dev

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.

Original languageEnglish
Title of host publication2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting
Subtitle of host publicationproceedings
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages717-718
Number of pages2
ISBN (Electronic)9781728166704, 9781728166698
ISBN (Print)9781728166711
DOIs
Publication statusPublished - 2020
Event2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting - Virtually, Toronto, Canada
Duration: 5 Jul 202010 Jul 2020

Publication series

Name
ISSN (Print)1522-3965
ISSN (Electronic)1947-1491

Conference

Conference2020 IEEE International Symposium on Antennas and Propagation North American Radio Science Meeting
Abbreviated titleIEEECONF 2020
CountryCanada
CityVirtually, Toronto
Period5/07/2010/07/20

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