Disorder mapping in VCSELs using frequency-selective feedback

T. Ackemann*, N. Radwell, Y. Noblet, R. Jäger

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)

    Abstract

    We report on a simple method with a high spectral and spatial resolution for mapping variations in the cavity resonance of a plano-planar broad-area laser based on frequency-selective feedback. The demonstration experiment uses a vertical-cavity surface-emitting-laser (VCSEL), in which growth induced inhomogeneities are of particular importance. It relies only on a standalone laser with a narrow-bandwidth passive filter avoiding the need for an expensive tunable laser or high-resolution spectrometer.

    Original languageEnglish
    Pages (from-to)1079-1081
    Number of pages3
    JournalOptics Letters
    Volume37
    Issue number6
    DOIs
    Publication statusPublished - 15 Mar 2012

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