Dispersion characteristics of multilayer coplanar waveguide using Single Layer Reduction (SLR) technique

Paramjeet Singh*, A. K. Verma

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

In this paper the Single Layer Reduction (SLR) technique is presented to compute dispersion characteristics of multilayer coplanar waveguide (CPW) with finite conductor thickness. The effective relative permittivity for the multilayer structure is derived from conformal mapping. Then SLR technique is used to convert multilayer CPW structure to an equivalent single layer structure. The dispersion characteristic of equivalent CPW structure is calculated from the closed form expressions.

Original languageEnglish
Title of host publicationTechSym 2011
Subtitle of host publicationProceedings of the 2011 IEEE Students' Technology Symposium
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages71-74
Number of pages4
ISBN (Electronic)9781424489428, 9781424489435
ISBN (Print)9781424489411
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event2011 2nd IEEE Students' Technology Symposium, TechSym 2011 - Kharagpur, India
Duration: 14 Jan 201116 Jan 2011

Other

Other2011 2nd IEEE Students' Technology Symposium, TechSym 2011
CountryIndia
CityKharagpur
Period14/01/1116/01/11

Keywords

  • Single Layer Reduction (SLR)
  • Coplanar Waveguide (CPW)
  • dispersion

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    Singh, P., & Verma, A. K. (2011). Dispersion characteristics of multilayer coplanar waveguide using Single Layer Reduction (SLR) technique. In TechSym 2011: Proceedings of the 2011 IEEE Students' Technology Symposium (pp. 71-74). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/TECHSYM.2011.5783804