Abstract
In this paper the Single Layer Reduction (SLR) technique is presented to compute dispersion characteristics of multilayer coplanar waveguide (CPW) with finite conductor thickness. The effective relative permittivity for the multilayer structure is derived from conformal mapping. Then SLR technique is used to convert multilayer CPW structure to an equivalent single layer structure. The dispersion characteristic of equivalent CPW structure is calculated from the closed form expressions.
Original language | English |
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Title of host publication | TechSym 2011 |
Subtitle of host publication | Proceedings of the 2011 IEEE Students' Technology Symposium |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 71-74 |
Number of pages | 4 |
ISBN (Electronic) | 9781424489428, 9781424489435 |
ISBN (Print) | 9781424489411 |
DOIs | |
Publication status | Published - 2011 |
Externally published | Yes |
Event | 2011 2nd IEEE Students' Technology Symposium, TechSym 2011 - Kharagpur, India Duration: 14 Jan 2011 → 16 Jan 2011 |
Other
Other | 2011 2nd IEEE Students' Technology Symposium, TechSym 2011 |
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Country/Territory | India |
City | Kharagpur |
Period | 14/01/11 → 16/01/11 |
Keywords
- Single Layer Reduction (SLR)
- Coplanar Waveguide (CPW)
- dispersion