Abstract
A novel view of dispersion of linearity in broad-band circuits is offered, whereby memory effects impart a frequency dependence to linearity of FET amplifiers. The considerable variation in intermodulation across wide bandwidths due to trapping and heating mechanisms are considered here as a dispersion of linearity that is bias dependent. This is of interest to designers because the dispersion gives intermodulation a strong dependence on center and spacing of test frequencies, which requires an interpretation of intermodulation measurements and specifications across the whole signal bandwidth. This is important for meeting legislative requirements or for designing for good spurious-free dynamic range, and for improving the performance of linearization techniques where band-limiting of optimal linear conditions may occur.
Original language | English |
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Title of host publication | Proceedings of the 1st European Microwave Integrated Circuits Conference, EuMIC 2006 |
Editors | Steve Marsh |
Place of Publication | Piscataway, NJ |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 320-323 |
Number of pages | 4 |
ISBN (Print) | 2960055187, 9782960055184 |
DOIs | |
Publication status | Published - 2007 |
Event | 1st European Microwave Integrated Circuits Conference, EuMIC 2006 - Manchester, United Kingdom Duration: 10 Sep 2006 → 12 Sep 2006 |
Other
Other | 1st European Microwave Integrated Circuits Conference, EuMIC 2006 |
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Country/Territory | United Kingdom |
City | Manchester |
Period | 10/09/06 → 12/09/06 |