Abstract
Stacked self-assembled In0.5Ga0.5As/GaAs quantum dot infrared photodetectors grown by low-pressure metal-organic chemical vapor deposition, with and without silicon dopants in the quantum dot layers, are investigated. The increase of dark currents observed at higher doping levels is attributed to higher defect density leading to stronger sequential resonant tunneling and to lowering of the operating temperature of the device.
Original language | English |
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Article number | 113510 |
Pages (from-to) | 113510-1-113510-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 89 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2006 |