Abstract
In this paper we first present a new fabrication process of downscaled graphene nanodevices based on direct milling of graphene using an atomic-size He+ ion beam. We then study the effects of the He+ ion exposure on the carrier transport properties in a bilayer graphene nanoribbon (GNR) by varying the time of He ion bombardment, along with underlying carrier scattering mechanisms. Finally we study the effects of various point defects in extremely-scaled GNRs on the carrier transport properties using ab initio simulation.
Original language | English |
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Title of host publication | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology |
Subtitle of host publication | proceedings |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Number of pages | 4 |
ISBN (Electronic) | 9781467324755 |
ISBN (Print) | 9781467324728 |
DOIs | |
Publication status | Published - 2012 |
Externally published | Yes |
Event | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012 - Xi'an, China Duration: 29 Oct 2012 → 1 Nov 2012 |
Conference
Conference | 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2012 |
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Country/Territory | China |
City | Xi'an |
Period | 29/10/12 → 1/11/12 |