Effect of the number of participating nodes on recovery of WSN coverage holes

Ali Rafiei, Mehran Abolhasan, Daniel R. Franklin, Farzad Safaei, Stephen Smith, Wei Ni

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

3 Citations (Scopus)

Abstract

Coverage holes (CHs) due to the correlated node failures, if not appropriately addressed in a timely manner, not only disrupt network's operation but also can compromise its integrity. In the absence of centralised control, distributed node relocation can be an effective solution to recover CHs. Relocation algorithms that mainly applied to all nodes to address networks' coverage and unbalanced deployments problems, are not efficient as participating nodes beyond a certain distance and depth from the CHs do not significantly contribute to recovery of CHs. Here, the effects of the number of participating nodes and movement iterations on recovery of CHs are examined in two Voronoi-based and one force-based node relocation algorithms.

Original languageEnglish
Title of host publication27th International Telecommunication Networks and Applications Conference
Subtitle of host publicationITNAC 2017
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-8
Number of pages8
ISBN (Electronic)9781509067961
ISBN (Print)9781509067978
DOIs
Publication statusPublished - 15 Dec 2017
Event27th International Telecommunication Networks and Applications Conference, ITNAC 2017 - Melbourne, Australia
Duration: 22 Nov 201724 Nov 2017

Conference

Conference27th International Telecommunication Networks and Applications Conference, ITNAC 2017
CountryAustralia
CityMelbourne
Period22/11/1724/11/17

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  • Cite this

    Rafiei, A., Abolhasan, M., Franklin, D. R., Safaei, F., Smith, S., & Ni, W. (2017). Effect of the number of participating nodes on recovery of WSN coverage holes. In 27th International Telecommunication Networks and Applications Conference: ITNAC 2017 (pp. 1-8). Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ATNAC.2017.8215433