Effect of transverse periodicity on the value of the effective dielectric constant for a microstrip line

L. Matekovits*, G. C. Vietti Colomè, M. Orefice

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

8 Citations (Scopus)
Original languageEnglish
Title of host publication2007 IEEE Antennas and Propagation Society International Symposium, AP-S
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages189-192
Number of pages4
ISBN (Print)1424408776, 9781424408771
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event2007 IEEE Antennas and Propagation Society International Symposium, AP-S - Honolulu, HI, United States
Duration: 10 Jun 200715 Jun 2007

Other

Other2007 IEEE Antennas and Propagation Society International Symposium, AP-S
CountryUnited States
CityHonolulu, HI
Period10/06/0715/06/07

Cite this

Matekovits, L., Vietti Colomè, G. C., & Orefice, M. (2007). Effect of transverse periodicity on the value of the effective dielectric constant for a microstrip line. In 2007 IEEE Antennas and Propagation Society International Symposium, AP-S (pp. 189-192). [4395462] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/APS.2007.4395462