Abstract
Effective width of a body-contacted MOSFET depends on the width offset, which comes from the specific layout one needs in Silicon-on-Insulator technology to contact the body node of these devices. This paper demonstrates and models the length dependence of the mentioned width-offset for 0.18 μm technology. The length dependence of width-offset is demonstrated by a simple technique of comparing linear currents of identical body-contacted and floating-body device for thick-oxide devices. Similar demonstration for thin-oxide devices is done by comparing maximum linear transcon-ductance (peak gm) of identical body contacted and floating body devices. This work then goes on to model this phenomenon semi-empirically. The improvement in the fits obtained with the proposed model over existing model validates it.
Original language | English |
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Title of host publication | Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009 |
Place of Publication | Boston, MA |
Publisher | Nano Science and Technology Institute |
Pages | 562-565 |
Number of pages | 4 |
Volume | 3 |
ISBN (Print) | 9781439817834, 9781439817841 |
Publication status | Published - 2009 |
Externally published | Yes |
Event | Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009 - Houston, TX, United States Duration: 3 May 2009 → 7 May 2009 |
Other
Other | Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009 |
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Country/Territory | United States |
City | Houston, TX |
Period | 3/05/09 → 7/05/09 |
Keywords
- Body-contact
- Floating body
- SOI
- Width-offset