Efficient numerical analysis of large planar high impedance surface by the Synthetic Function eXpansion technique

Ladislau Matekovits*, Giuseppe Vecchi, Mirko Bercigli, Mauro Bandinelli

*Corresponding author for this work

Research output: Contribution to journalArticle

7 Citations (Scopus)


Application is presented of the Synthetic Function eXpansion (SFX) method to the accurate analysis of devices that incorporate microstrip-technology electromagnetic band-gap structures of large but finite size. The strong reduction of the dimension of the system matrix achieved employing the SFX technique reduces the solution time and the memory occupation, making it possible to analyze large structures on standard computational hardware. Experimental verification confirms the validity of the approach.

Original languageEnglish
Pages (from-to)2763-2769
Number of pages7
JournalMicrowave and Optical Technology Letters
Issue number11
Publication statusPublished - Nov 2009
Externally publishedYes



  • Aggregate functions
  • Degrees of freedom
  • Electromagnetic band-gap structures
  • High impedance surface
  • Integral equation technique
  • Large structures

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