Abstract
Application is presented of the Synthetic Function eXpansion (SFX) method to the accurate analysis of devices that incorporate microstrip-technology electromagnetic band-gap structures of large but finite size. The strong reduction of the dimension of the system matrix achieved employing the SFX technique reduces the solution time and the memory occupation, making it possible to analyze large structures on standard computational hardware. Experimental verification confirms the validity of the approach.
Original language | English |
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Pages (from-to) | 2763-2769 |
Number of pages | 7 |
Journal | Microwave and Optical Technology Letters |
Volume | 51 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 2009 |
Externally published | Yes |
Keywords
- Aggregate functions
- Degrees of freedom
- Electromagnetic band-gap structures
- High impedance surface
- Integral equation technique
- Large structures