Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells

Arman Mahboubi Soufiani, Murad J. Y. Tayebjee, Steffen Meyer, Anita Ho-Baillie, Jae Sung Yun, Rowan W. McQueen, Leone Spiccia, Martin A. Green, Ziv Hameiri

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18 Citations (Scopus)

Abstract

In this study, we provide insights into planar structure methylammonium lead triiodide (MAPbI 3 ) perovskite solar cells (PSCs) using electroluminescence and photoluminescence imaging techniques. We demonstrate the strength of these techniques in screening relatively large area PSCs, correlating the solar cell electrical parameters to the images and visualizing the features which contribute to the variation of the parameters extracted from current density-voltage characterizations. It is further used to investigate one of the major concerns about perovskite solar cells, their long term stability and aging. Upon storage under dark in dry glovebox condition for more than two months, the major parameter found to have deteriorated in electrical performance measurements was the fill factor; this was elucidated via electroluminescence image comparisons which revealed that the contacts' quality degrades. Interestingly, by deploying electroluminescence imaging, the significance of having a pin-hole free active layer is demonstrated. Pin-holes can grow over time and can cause degradation of the active layer surrounding them.

Original languageEnglish
Article number035702
Number of pages7
JournalJournal of Applied Physics
Volume120
Issue number3
DOIs
Publication statusPublished - 21 Jul 2016
Externally publishedYes

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    Soufiani, A. M., Tayebjee, M. J. Y., Meyer, S., Ho-Baillie, A., Sung Yun, J., McQueen, R. W., ... Hameiri, Z. (2016). Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells. Journal of Applied Physics, 120(3), [035702]. https://doi.org/10.1063/1.4956436