Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

Yufeng Zhang, James E. Downes, Shancai Wang, Timothy Learmonth, Lukasz Plucinski, A. Y. Matsuura, Cormac McGuinness, Per Anders Glans, Sarah Bernardis, Cian O'Donnell, Kevin E. Smith*

*Corresponding author for this work

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.

Original languageEnglish
Pages (from-to)394-400
Number of pages7
JournalThin Solid Films
Volume515
Issue number2 SPEC. ISS.
DOIs
Publication statusPublished - 25 Oct 2006
Externally publishedYes

Keywords

  • Organic semiconductors
  • X-ray emission

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