Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

Yufeng Zhang; James E. Downes; Shancai Wang; Timothy Learmonth; Lukasz Plucinski; A. Y. Matsuura; Cormac McGuinness; Per Anders Glans; Sarah Bernardis; Cian O'Donnell; Kevin E. Smith

doi:10.1016/j.tsf.2005.12.221

Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

Yufeng Zhang, James E. Downes, Shancai Wang, Timothy Learmonth, Lukasz Plucinski, A. Y. Matsuura, Cormac McGuinness, Per Anders Glans, Sarah Bernardis, Cian O'Donnell, Kevin E. Smith^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near E_F. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.

Original language	English
Pages (from-to)	394-400
Number of pages	7
Journal	Thin Solid Films
Volume	515
Issue number	2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.tsf.2005.12.221
Publication status	Published - 25 Oct 2006
Externally published	Yes

Keywords

Organic semiconductors
X-ray emission

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10.1016/j.tsf.2005.12.221

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Zhang, Y., Downes, J. E., Wang, S., Learmonth, T., Plucinski, L., Matsuura, A. Y., McGuinness, C., Glans, P. A., Bernardis, S., O'Donnell, C., & Smith, K. E. (2006). Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering. Thin Solid Films, 515(2 SPEC. ISS.), 394-400. https://doi.org/10.1016/j.tsf.2005.12.221

@article{0d705f690474494ab21277ae67098f80,

title = "Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering",

abstract = "The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.",

keywords = "Organic semiconductors, X-ray emission",

author = "Yufeng Zhang and Downes, \{James E.\} and Shancai Wang and Timothy Learmonth and Lukasz Plucinski and Matsuura, \{A. Y.\} and Cormac McGuinness and Glans, \{Per Anders\} and Sarah Bernardis and Cian O'Donnell and Smith, \{Kevin E.\}",

year = "2006",

month = oct,

day = "25",

doi = "10.1016/j.tsf.2005.12.221",

language = "English",

volume = "515",

pages = "394--400",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "2 SPEC. ISS.",

}

Zhang, Y, Downes, JE, Wang, S, Learmonth, T, Plucinski, L, Matsuura, AY, McGuinness, C, Glans, PA, Bernardis, S, O'Donnell, C & Smith, KE 2006, 'Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering', Thin Solid Films, vol. 515, no. 2 SPEC. ISS., pp. 394-400. https://doi.org/10.1016/j.tsf.2005.12.221

TY - JOUR

T1 - Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

AU - Zhang, Yufeng

AU - Downes, James E.

AU - Wang, Shancai

AU - Learmonth, Timothy

AU - Plucinski, Lukasz

AU - Matsuura, A. Y.

AU - McGuinness, Cormac

AU - Glans, Per Anders

AU - Bernardis, Sarah

AU - O'Donnell, Cian

AU - Smith, Kevin E.

PY - 2006/10/25

Y1 - 2006/10/25

N2 - The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.

AB - The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.

KW - Organic semiconductors

KW - X-ray emission

UR - https://www.scopus.com/pages/publications/33748901123

U2 - 10.1016/j.tsf.2005.12.221

DO - 10.1016/j.tsf.2005.12.221

M3 - Article

AN - SCOPUS:33748901123

SN - 0040-6090

VL - 515

SP - 394

EP - 400

JO - Thin Solid Films

JF - Thin Solid Films

IS - 2 SPEC. ISS.

ER -

Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering

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Keywords

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