Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine

James E. Downes; Cormac McGuinness; Per Anders Glans; Timothy Learmonth; Dongfeng Fu; Paul Sheridan; Kevin E. Smith

doi:10.1016/j.cplett.2004.04.026

Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine

James E. Downes, Cormac McGuinness, Per Anders Glans, Timothy Learmonth, Dongfeng Fu, Paul Sheridan, Kevin E. Smith^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

43 Citations (Scopus)

Abstract

The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near E_F. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage.

Original language	English
Pages (from-to)	203-207
Number of pages	5
Journal	Chemical Physics Letters
Volume	390
Issue number	1-3
DOIs	https://doi.org/10.1016/j.cplett.2004.04.026
Publication status	Published - 21 May 2004
Externally published	Yes

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10.1016/j.cplett.2004.04.026

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title = "Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine",

abstract = "The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage.",

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AU - Downes, James E.

AU - McGuinness, Cormac

AU - Glans, Per Anders

AU - Learmonth, Timothy

AU - Fu, Dongfeng

AU - Sheridan, Paul

AU - Smith, Kevin E.

PY - 2004/5/21

Y1 - 2004/5/21

N2 - The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage.

AB - The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage.

UR - http://www.scopus.com/inward/record.url?scp=2342638326&partnerID=8YFLogxK

U2 - 10.1016/j.cplett.2004.04.026

DO - 10.1016/j.cplett.2004.04.026

M3 - Article

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VL - 390

SP - 203

EP - 207

JO - Chemical Physics Letters

JF - Chemical Physics Letters

SN - 0009-2614

IS - 1-3

ER -

Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine

Abstract

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