Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP)

Ian Reid*, Yufeng Zhang, Alex Demasi, Andrew Blueser, Louis Piper, James E. Downes, Anne Matsuura, Greg Hughes, Kevin E. Smith

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations.

Original languageEnglish
Pages (from-to)720-725
Number of pages6
JournalApplied Surface Science
Volume256
Issue number3
DOIs
Publication statusPublished - 15 Nov 2009

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