TY - GEN
T1 - Enterprises internal management investigation and analysis
AU - Guo, Wenting
AU - Liu, Bing
AU - Liu, Yonggui
PY - 2012
Y1 - 2012
N2 - This thesis takes practical enterprise internal investigation of the consulting company for instance, thoroughly introducing the aim, content, method, analysis as well as report of this investigation. This investigation group conducted a thorough and systematic investigation to the internal management through the methods of desk research, materials consultation, on-the-spot investigation, anonymous questionnaire survey, post readme, in-depth interview, and visiting customers and the suppliers and displayed present situations and reform suggestions at aspects on company's strategic management, corporate culture, human resources management, production and quality management, sales management, financial management and management system.
AB - This thesis takes practical enterprise internal investigation of the consulting company for instance, thoroughly introducing the aim, content, method, analysis as well as report of this investigation. This investigation group conducted a thorough and systematic investigation to the internal management through the methods of desk research, materials consultation, on-the-spot investigation, anonymous questionnaire survey, post readme, in-depth interview, and visiting customers and the suppliers and displayed present situations and reform suggestions at aspects on company's strategic management, corporate culture, human resources management, production and quality management, sales management, financial management and management system.
KW - Enterprise management
KW - Internal investigation
KW - Investigation method
KW - Investigation process
U2 - 10.4028/www.scientific.net/AMR.403-408.1640
DO - 10.4028/www.scientific.net/AMR.403-408.1640
M3 - Conference proceeding contribution
SN - 9783037853122
VL - 403-408
T3 - Advanced materials research
SP - 1640
EP - 1643
BT - MEMS, NANO, and Smart Systems
A2 - Yuan, Li
PB - Trans Tech Publications
CY - Durnten-Zurich, Switzerland ; Enfield, NH
T2 - International Conference on MEMS, NANO, and Smart Systems (7th : 2011)
Y2 - 4 November 2011 through 6 November 2011
ER -