Epitaxial layer-by-layer growth of Yb: YAG and YbAG PLD-films

Teoman Gün*, Yury Kuzminykh, Friedjof Tellkamp, Klaus Petermann, Günter Huber

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)


    In this contribution, we report on the 2-dimensional (2D) layer-by-layer growth of Yb(10%):Y3Al5O12 (YAG) and Yb 3Al5O12 (YbAG) PLD-films on {100}-oriented YAG. The epitaxial growth was observed in situ by Reflection High Energy Electron Diffraction (RHEED) as intensity oscillations of the specularly reflected electron beam. The properties of the films were investigated ex situ by means of X-ray diffraction (XRD), atomic force microscopy (AFM), and optical spectroscopy. The optical emission spectra of the films are similar to those of the corresponding crystalline bulk materials.

    Original languageEnglish
    Pages (from-to)387-391
    Number of pages5
    JournalApplied Physics A: Materials Science & Processing
    Issue number2
    Publication statusPublished - Nov 2008


    Dive into the research topics of 'Epitaxial layer-by-layer growth of Yb: YAG and YbAG PLD-films'. Together they form a unique fingerprint.

    Cite this