TY - JOUR
T1 - Epitaxial layer-by-layer growth of Yb
T2 - YAG and YbAG PLD-films
AU - Gün, Teoman
AU - Kuzminykh, Yury
AU - Tellkamp, Friedjof
AU - Petermann, Klaus
AU - Huber, Günter
PY - 2008/11
Y1 - 2008/11
N2 - In this contribution, we report on the 2-dimensional (2D) layer-by-layer growth of Yb(10%):Y3Al5O12 (YAG) and Yb 3Al5O12 (YbAG) PLD-films on {100}-oriented YAG. The epitaxial growth was observed in situ by Reflection High Energy Electron Diffraction (RHEED) as intensity oscillations of the specularly reflected electron beam. The properties of the films were investigated ex situ by means of X-ray diffraction (XRD), atomic force microscopy (AFM), and optical spectroscopy. The optical emission spectra of the films are similar to those of the corresponding crystalline bulk materials.
AB - In this contribution, we report on the 2-dimensional (2D) layer-by-layer growth of Yb(10%):Y3Al5O12 (YAG) and Yb 3Al5O12 (YbAG) PLD-films on {100}-oriented YAG. The epitaxial growth was observed in situ by Reflection High Energy Electron Diffraction (RHEED) as intensity oscillations of the specularly reflected electron beam. The properties of the films were investigated ex situ by means of X-ray diffraction (XRD), atomic force microscopy (AFM), and optical spectroscopy. The optical emission spectra of the films are similar to those of the corresponding crystalline bulk materials.
UR - http://www.scopus.com/inward/record.url?scp=51649125125&partnerID=8YFLogxK
U2 - 10.1007/s00339-008-4844-0
DO - 10.1007/s00339-008-4844-0
M3 - Article
AN - SCOPUS:51649125125
SN - 0947-8396
VL - 93
SP - 387
EP - 391
JO - Applied Physics A: Materials Science & Processing
JF - Applied Physics A: Materials Science & Processing
IS - 2
ER -