Epitaxial layer-by-layer growth of Yb

YAG and YbAG PLD-films

Teoman Gün*, Yury Kuzminykh, Friedjof Tellkamp, Klaus Petermann, Günter Huber

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In this contribution, we report on the 2-dimensional (2D) layer-by-layer growth of Yb(10%):Y3Al5O12 (YAG) and Yb 3Al5O12 (YbAG) PLD-films on {100}-oriented YAG. The epitaxial growth was observed in situ by Reflection High Energy Electron Diffraction (RHEED) as intensity oscillations of the specularly reflected electron beam. The properties of the films were investigated ex situ by means of X-ray diffraction (XRD), atomic force microscopy (AFM), and optical spectroscopy. The optical emission spectra of the films are similar to those of the corresponding crystalline bulk materials.

Original languageEnglish
Pages (from-to)387-391
Number of pages5
JournalApplied Physics A
Volume93
Issue number2
DOIs
Publication statusPublished - Nov 2008

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    Gün, T., Kuzminykh, Y., Tellkamp, F., Petermann, K., & Huber, G. (2008). Epitaxial layer-by-layer growth of Yb: YAG and YbAG PLD-films. Applied Physics A, 93(2), 387-391. https://doi.org/10.1007/s00339-008-4844-0