Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs

M. Nordin*, C. Abrahamsson, C. H. Blomqvist, H. Häbel, M. Röding, E. Olsson, M. Nydén, M. Rudemo

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In this study, we investigate the functional behaviour of the intensity in high-angle annular dark field scanning transmission electron micrograph images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction.

The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a scanning transmission electron micrograph.

Original languageEnglish
Pages (from-to)166-170
Number of pages5
JournalJournal of Microscopy
Volume253
Issue number2
DOIs
Publication statusPublished - Feb 2014
Externally publishedYes

Keywords

  • Likelihood
  • mass thickness
  • scanning transmission electron microscopy
  • structural characterization

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