Abstract
In this study, we investigate the functional behaviour of the intensity in high-angle annular dark field scanning transmission electron micrograph images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction.
The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a scanning transmission electron micrograph.
Original language | English |
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Pages (from-to) | 166-170 |
Number of pages | 5 |
Journal | Journal of Microscopy |
Volume | 253 |
Issue number | 2 |
DOIs | |
Publication status | Published - Feb 2014 |
Externally published | Yes |
Keywords
- Likelihood
- mass thickness
- scanning transmission electron microscopy
- structural characterization