Evaluating the accuracy of point spread function deconvolutions applied to luminescence images

David N.R. Payne, Mattias K. Juhl, Michael E. Pollard, Anthony Teal, Darren M. Bagnall

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

8 Citations (Scopus)

Abstract

Luminescence imaging is a widely used characterization technique for silicon photovoltaics. However, the tools used to acquire images typically utilize a silicon CCD array for detection, which is a poor absorber at silicon luminescence wavelengths. This leads to a smearing effect in the measured image which can be characterized by a point spread function (PSF). If the true PSF is known then the measured image can be restored through deconvolution. Several methods exist for determining a PSF for a particular imaging system and different extraction techniques can lead to variations in the PSF result, yet no studies have provided comprehensive analysis of PSF deconvolution accuracy when applied to luminescence imaging. In this work, several new techniques have been designed and investigated in order to test PSF deconvolution results, with a view to quantifying improvement or errors generated and potentially leading towards improved image restoration.

Original languageEnglish
Title of host publicationIEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1585-1589
Number of pages5
ISBN (Electronic)9781509027248
ISBN (Print)9781509027255
DOIs
Publication statusPublished - 2016
Externally publishedYes
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
CountryUnited States
CityPortland
Period5/06/1610/06/16

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