Exact SEP of optimum combining in the presence of noise and rician-faded interferers

Alberto Zanella*, Matthew R. McKay, Iain B. Collings, Marco Chiani

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contributionpeer-review

Abstract

In this paper, we investigate the performance of optimum combining multiple antenna systems in the presence of Rician-faded interferers. We assume that the desired user is subjected to Rayleigh fading but interferers undergo Rician fading. Unlike other approaches addressing optimum combining with Rician fading, we consider the effect of both interference and thermal noise. Our methodology is based on the evaluation of the moment generating function of the signal-to-interference-plus-noise (SINR) ratio at the output of the combiner. Our results are exact, and allow the calculation of the symbol error probability (SEP) for M-PSK signals with arbitrary number of antennas and interferers.

Original languageEnglish
Title of host publication2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1931-1935
Number of pages5
ISBN (Print)1424402662, 9781424402663
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring - Dublin, Ireland
Duration: 22 Apr 200725 Apr 2007

Other

Other2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring
CountryIreland
CityDublin
Period22/04/0725/04/07

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