Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation

Thibault Pichon; Olivier Boulade; Salima Mouzali; Patrick Mulet; Simone De Camillis; Charbel Koumeir; Jean Louis Santailler; Giacomo Badano; Olivier Gravrand; Olivier Limousin

doi:10.1117/12.2562142

Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation

Thibault Pichon^*, Olivier Boulade, Salima Mouzali, Patrick Mulet, Simone De Camillis, Charbel Koumeir, Jean Louis Santailler, Giacomo Badano, Olivier Gravrand, Olivier Limousin

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

3 Citations (Scopus)

Abstract

Experimental study of the influence of the CdZnTe substrate thickness on the response of IR detectors under irradiation has been performed. Two detectors, with different substrate thickness 800 μm and 50 μm, were submitted to low flux 62 MeV proton irradiation.Images acquired under irradiation were analyzed. Whereas the detector with 800 μm substrate thickness has shown background signal increase under irradiation, the detector with the substrate partially removed has not shown any background signal elevation. The elevation of the background signal under irradiation in the detector with intact substrate is attributed to the large extension of one transient event as reveal by the derivation of one transient event. The results of the irradiation campaign are further compared to simulations. This comparison shows very good agreement and highlights the role of emission of low energy photons inside the substrate which are in turn detected by the light sensitive layer.

Original language	English
Title of host publication	X-Ray, Optical, and Infrared Detectors for Astronomy IX
Editors	Andrew D. Holland, James Beletic
Place of Publication	Bellingham, Washington
Publisher	SPIE
Pages	114540O-1-114540O-15
Number of pages	15
ISBN (Electronic)	9781510636965
ISBN (Print)	9781510636958
DOIs	https://doi.org/10.1117/12.2562142
Publication status	Published - 14 Dec 2020
Event	X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020 - Virtual, Online, United States Duration: 14 Dec 2020 → 22 Dec 2020

Publication series

Name	Proceedings of SPIE
Publisher	SPIE
Volume	11454
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020
Country/Territory	United States
City	Virtual, Online
Period	14/12/20 → 22/12/20

Keywords

CdZnTe
HgCdTe
Luminescence
Radiation effects

Access to Document

10.1117/12.2562142

Cite this

Pichon, T., Boulade, O., Mouzali, S., Mulet, P., De Camillis, S., Koumeir, C., Santailler, J. L., Badano, G., Gravrand, O., & Limousin, O. (2020). Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation. In A. D. Holland, & J. Beletic (Eds.), X-Ray, Optical, and Infrared Detectors for Astronomy IX (pp. 114540O-1-114540O-15). Article 114540O (Proceedings of SPIE; Vol. 11454). SPIE. https://doi.org/10.1117/12.2562142

Pichon, Thibault ; Boulade, Olivier ; Mouzali, Salima et al. / Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation. X-Ray, Optical, and Infrared Detectors for Astronomy IX. editor / Andrew D. Holland ; James Beletic. Bellingham, Washington : SPIE, 2020. pp. 114540O-1-114540O-15 (Proceedings of SPIE).

@inproceedings{c8ad3033281c41a2b9850365761d4158,

title = "Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation",

abstract = "Experimental study of the influence of the CdZnTe substrate thickness on the response of IR detectors under irradiation has been performed. Two detectors, with different substrate thickness 800 μm and 50 μm, were submitted to low flux 62 MeV proton irradiation.Images acquired under irradiation were analyzed. Whereas the detector with 800 μm substrate thickness has shown background signal increase under irradiation, the detector with the substrate partially removed has not shown any background signal elevation. The elevation of the background signal under irradiation in the detector with intact substrate is attributed to the large extension of one transient event as reveal by the derivation of one transient event. The results of the irradiation campaign are further compared to simulations. This comparison shows very good agreement and highlights the role of emission of low energy photons inside the substrate which are in turn detected by the light sensitive layer.",

keywords = "CdZnTe, HgCdTe, Luminescence, Radiation effects",

author = "Thibault Pichon and Olivier Boulade and Salima Mouzali and Patrick Mulet and {De Camillis}, Simone and Charbel Koumeir and Santailler, {Jean Louis} and Giacomo Badano and Olivier Gravrand and Olivier Limousin",

year = "2020",

month = dec,

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doi = "10.1117/12.2562142",

language = "English",

isbn = "9781510636958",

series = "Proceedings of SPIE",

publisher = "SPIE",

pages = "114540O--1--114540O--15",

editor = "Holland, {Andrew D.} and James Beletic",

booktitle = "X-Ray, Optical, and Infrared Detectors for Astronomy IX",

address = "United States",

note = "X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020 ; Conference date: 14-12-2020 Through 22-12-2020",

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Pichon, T, Boulade, O, Mouzali, S, Mulet, P, De Camillis, S, Koumeir, C, Santailler, JL, Badano, G, Gravrand, O & Limousin, O 2020, Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation. in AD Holland & J Beletic (eds), X-Ray, Optical, and Infrared Detectors for Astronomy IX., 114540O, Proceedings of SPIE, vol. 11454, SPIE, Bellingham, Washington, pp. 114540O-1-114540O-15, X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020, Virtual, Online, United States, 14/12/20. https://doi.org/10.1117/12.2562142

Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation. / Pichon, Thibault; Boulade, Olivier; Mouzali, Salima et al.
X-Ray, Optical, and Infrared Detectors for Astronomy IX. ed. / Andrew D. Holland; James Beletic. Bellingham, Washington: SPIE, 2020. p. 114540O-1-114540O-15 114540O (Proceedings of SPIE; Vol. 11454).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

TY - GEN

T1 - Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation

AU - Pichon, Thibault

AU - Boulade, Olivier

AU - Mouzali, Salima

AU - Mulet, Patrick

AU - De Camillis, Simone

AU - Koumeir, Charbel

AU - Santailler, Jean Louis

AU - Badano, Giacomo

AU - Gravrand, Olivier

AU - Limousin, Olivier

PY - 2020/12/14

Y1 - 2020/12/14

N2 - Experimental study of the influence of the CdZnTe substrate thickness on the response of IR detectors under irradiation has been performed. Two detectors, with different substrate thickness 800 μm and 50 μm, were submitted to low flux 62 MeV proton irradiation.Images acquired under irradiation were analyzed. Whereas the detector with 800 μm substrate thickness has shown background signal increase under irradiation, the detector with the substrate partially removed has not shown any background signal elevation. The elevation of the background signal under irradiation in the detector with intact substrate is attributed to the large extension of one transient event as reveal by the derivation of one transient event. The results of the irradiation campaign are further compared to simulations. This comparison shows very good agreement and highlights the role of emission of low energy photons inside the substrate which are in turn detected by the light sensitive layer.

AB - Experimental study of the influence of the CdZnTe substrate thickness on the response of IR detectors under irradiation has been performed. Two detectors, with different substrate thickness 800 μm and 50 μm, were submitted to low flux 62 MeV proton irradiation.Images acquired under irradiation were analyzed. Whereas the detector with 800 μm substrate thickness has shown background signal increase under irradiation, the detector with the substrate partially removed has not shown any background signal elevation. The elevation of the background signal under irradiation in the detector with intact substrate is attributed to the large extension of one transient event as reveal by the derivation of one transient event. The results of the irradiation campaign are further compared to simulations. This comparison shows very good agreement and highlights the role of emission of low energy photons inside the substrate which are in turn detected by the light sensitive layer.

KW - CdZnTe

KW - HgCdTe

KW - Luminescence

KW - Radiation effects

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U2 - 10.1117/12.2562142

DO - 10.1117/12.2562142

M3 - Conference proceeding contribution

AN - SCOPUS:85099392018

SN - 9781510636958

T3 - Proceedings of SPIE

SP - 114540O-1-114540O-15

BT - X-Ray, Optical, and Infrared Detectors for Astronomy IX

A2 - Holland, Andrew D.

A2 - Beletic, James

PB - SPIE

CY - Bellingham, Washington

T2 - X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020

Y2 - 14 December 2020 through 22 December 2020

ER -

Pichon T, Boulade O, Mouzali S, Mulet P, De Camillis S, Koumeir C et al. Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation. In Holland AD, Beletic J, editors, X-Ray, Optical, and Infrared Detectors for Astronomy IX. Bellingham, Washington: SPIE. 2020. p. 114540O-1-114540O-15. 114540O. (Proceedings of SPIE). doi: 10.1117/12.2562142

Experimental study of the influence of the CdZnTe substrate thickness on the response of infrared HgCdTe photodetectors under proton irradiation

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