Experimental verification of conductor loss model for thin film microstrip line

Ritu Bansal, Paramjeet Singh, A. K. Verma

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.

Original languageEnglish
Title of host publicationACCT 2013
Subtitle of host publicationProceedings of the 2013 Third International Conference on Advanced Computing and Communication Technologies
Place of PublicationPiscataway, NJ
PublisherConference Publishing Services
Pages208-210
Number of pages3
ISBN (Print)9780769549415
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013 - Rohtak, Haryana, India
Duration: 6 Apr 20137 Apr 2013

Other

Other2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013
CountryIndia
CityRohtak, Haryana
Period6/04/137/04/13

Keywords

  • Conductivity
  • Conductor loss
  • Holloway & Kuester
  • MMIC and THz
  • Perturbation method
  • TFMS

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