Experimental verification of conductor loss model for thin film microstrip line

Ritu Bansal; Paramjeet Singh; A. K. Verma

doi:10.1109/ACCT.2013.52

Experimental verification of conductor loss model for thin film microstrip line

Ritu Bansal, Paramjeet Singh, A. K. Verma

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

Abstract

This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.

Original language	English
Title of host publication	ACCT 2013
Subtitle of host publication	Proceedings of the 2013 Third International Conference on Advanced Computing and Communication Technologies
Place of Publication	Piscataway, NJ
Publisher	Conference Publishing Services
Pages	208-210
Number of pages	3
ISBN (Print)	9780769549415
DOIs	https://doi.org/10.1109/ACCT.2013.52
Publication status	Published - 2013
Externally published	Yes
Event	2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013 - Rohtak, Haryana, India Duration: 6 Apr 2013 → 7 Apr 2013

Other

Other	2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013
Country/Territory	India
City	Rohtak, Haryana
Period	6/04/13 → 7/04/13

Keywords

Conductivity
Conductor loss
Holloway & Kuester
MMIC and THz
Perturbation method
TFMS

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10.1109/ACCT.2013.52

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title = "Experimental verification of conductor loss model for thin film microstrip line",

abstract = "This paper presents the improved perturbation based model of Holloway & Kuester for conductor loss computation. The model presented takes into account the frequency dependent nature of conductivity of thin film conductor. We have also shown comparison of Present model with experimental results for the frequency range 1 to 100 GHz. Deviations of the improved model from experimental are found below 9%.",

keywords = "Conductivity, Conductor loss, Holloway & Kuester, MMIC and THz, Perturbation method, TFMS",

author = "Ritu Bansal and Paramjeet Singh and Verma, {A. K.}",

year = "2013",

doi = "10.1109/ACCT.2013.52",

language = "English",

isbn = "9780769549415",

pages = "208--210",

booktitle = "ACCT 2013",

publisher = "Conference Publishing Services",

note = "2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013 ; Conference date: 06-04-2013 Through 07-04-2013",

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Bansal, R, Singh, P & Verma, AK 2013, Experimental verification of conductor loss model for thin film microstrip line. in ACCT 2013: Proceedings of the 2013 Third International Conference on Advanced Computing and Communication Technologies. Conference Publishing Services, Piscataway, NJ, pp. 208-210, 2013 3rd International Conference on Advanced Computing and Communication Technologies, ACCT 2013, Rohtak, Haryana, India, 6/04/13. https://doi.org/10.1109/ACCT.2013.52

Experimental verification of conductor loss model for thin film microstrip line. / Bansal, Ritu; Singh, Paramjeet; Verma, A. K.
ACCT 2013: Proceedings of the 2013 Third International Conference on Advanced Computing and Communication Technologies. Piscataway, NJ: Conference Publishing Services, 2013. p. 208-210.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution › peer-review

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KW - Holloway & Kuester

KW - MMIC and THz

KW - Perturbation method

KW - TFMS

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Experimental verification of conductor loss model for thin film microstrip line

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