Fabrication of ultra-low bend loss optical waveguides

A. Arriola, S. Gross, N. Jovanovic, N. Charles, P. G. Tuthill, S. M. Olaizola, A. Fuerbach, M. J. Withford

Research output: Chapter in Book/Report/Conference proceedingConference proceeding contribution

Abstract

We present a novel way to fabricate low bend loss femtosecond-laser written optical waveguides [1] via a two-step process: We first fabricate large-diameter waveguides which are multimode at 1550 nm and exhibit a relatively complex refractive index distribution. In a second step, thermal post-processing [2] results in the selective removal of part of the previously induced refractive index change, leaving behind a very high index contrast waveguide that enables single mode operation in the C-band. We demonstrate that this procedure enables the fabrication of waveguides with unprecedented small bends (down to 16.6 mm radius) [3] with high (80%) normalized throughputs.

Original languageEnglish
Title of host publication2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC 2013)
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-1
Number of pages1
ISBN (Electronic)9781479905942
ISBN (Print)9781479905928
DOIs
Publication statusPublished - 2013
Event2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013 - Munich, Germany
Duration: 12 May 201316 May 2013

Other

Other2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013
CountryGermany
CityMunich
Period12/05/1316/05/13

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  • Cite this

    Arriola, A., Gross, S., Jovanovic, N., Charles, N., Tuthill, P. G., Olaizola, S. M., ... Withford, M. J. (2013). Fabrication of ultra-low bend loss optical waveguides. In 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC 2013) (pp. 1-1). [6801562] Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CLEOE-IQEC.2013.6801562