Fast, robust and simple all optical far-field nano-positioning measurements

M. L. Juan; N. Tischler; I. Fernandez-Corbaton; X. Zambrana-Puyalto; X. Vidal; G. Molina-Terriza

Fast, robust and simple all optical far-field nano-positioning measurements

M. L. Juan, N. Tischler, I. Fernandez-Corbaton, X. Zambrana-Puyalto, X. Vidal, G. Molina-Terriza

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

Abstract

We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.

Original language	English
Title of host publication	Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Editors	Matthew Laudon, Bart Romanowicz
Place of Publication	Boston, MA
Publisher	Nano Science and Technology Institute
Pages	412-415
Number of pages	4
Volume	2
ISBN (Electronic)	9781482206043
ISBN (Print)	9781482205848, 9781482205794
Publication status	Published - 2013
Event	Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 - Washington, DC, United States Duration: 12 May 2013 → 16 May 2013

Other

Other	Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Country/Territory	United States
City	Washington, DC
Period	12/05/13 → 16/05/13

Cite this

Juan, M. L., Tischler, N., Fernandez-Corbaton, I., Zambrana-Puyalto, X., Vidal, X., & Molina-Terriza, G. (2013). Fast, robust and simple all optical far-field nano-positioning measurements. In M. Laudon, & B. Romanowicz (Eds.), Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 (Vol. 2, pp. 412-415). Nano Science and Technology Institute.

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title = "Fast, robust and simple all optical far-field nano-positioning measurements",

abstract = "We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.",

author = "Juan, \{M. L.\} and N. Tischler and I. Fernandez-Corbaton and X. Zambrana-Puyalto and X. Vidal and G. Molina-Terriza",

year = "2013",

language = "English",

isbn = "9781482205848",

volume = "2",

pages = "412--415",

editor = "Matthew Laudon and Bart Romanowicz",

booktitle = "Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013",

publisher = "Nano Science and Technology Institute",

note = "Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 ; Conference date: 12-05-2013 Through 16-05-2013",

}

Juan, ML, Tischler, N, Fernandez-Corbaton, I, Zambrana-Puyalto, X, Vidal, X & Molina-Terriza, G 2013, Fast, robust and simple all optical far-field nano-positioning measurements. in M Laudon & B Romanowicz (eds), Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. vol. 2, Nano Science and Technology Institute, Boston, MA, pp. 412-415, Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013, Washington, DC, United States, 12/05/13.

Fast, robust and simple all optical far-field nano-positioning measurements. / Juan, M. L.; Tischler, N.; Fernandez-Corbaton, I. et al.
Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. ed. / Matthew Laudon; Bart Romanowicz. Vol. 2 Boston, MA: Nano Science and Technology Institute, 2013. p. 412-415.

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding contribution

TY - GEN

T1 - Fast, robust and simple all optical far-field nano-positioning measurements

AU - Juan, M. L.

AU - Tischler, N.

AU - Fernandez-Corbaton, I.

AU - Zambrana-Puyalto, X.

AU - Vidal, X.

AU - Molina-Terriza, G.

PY - 2013

Y1 - 2013

N2 - We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.

AB - We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.

UR - https://www.scopus.com/pages/publications/84881110040

M3 - Conference proceeding contribution

AN - SCOPUS:84881110040

SN - 9781482205848

SN - 9781482205794

VL - 2

SP - 412

EP - 415

BT - Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013

A2 - Laudon, Matthew

A2 - Romanowicz, Bart

PB - Nano Science and Technology Institute

CY - Boston, MA

T2 - Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013

Y2 - 12 May 2013 through 16 May 2013

ER -

Juan ML, Tischler N, Fernandez-Corbaton I, Zambrana-Puyalto X, Vidal X, Molina-Terriza G. Fast, robust and simple all optical far-field nano-positioning measurements. In Laudon M, Romanowicz B, editors, Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. Vol. 2. Boston, MA: Nano Science and Technology Institute. 2013. p. 412-415

Fast, robust and simple all optical far-field nano-positioning measurements

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