Few-layer graphene under high pressure: Raman and X-ray diffraction studies

S. M. Clark*, Ki Joon Jeon, Jing Yin Chen, Choong Shik Yoo

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    72 Citations (Scopus)

    Abstract

    The effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of ∼2.8 Å (or above ∼18 GPa), while maintaining the local sp2 hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress.

    Original languageEnglish
    Pages (from-to)15-18
    Number of pages4
    JournalSolid State Communications
    Volume154
    DOIs
    Publication statusPublished - Jan 2013

    Fingerprint Dive into the research topics of 'Few-layer graphene under high pressure: Raman and X-ray diffraction studies'. Together they form a unique fingerprint.

    Cite this